Observation of 1-nm-High Structures on a Si (001) Surface Using a Differential Interference Optical Microscope

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1995-06-15

著者

• Ishizaka Akitoshi

  Central Research Laboratory Hitachi Ltd.

• ICHIKAWA Masakazu

  Joint Research Center for Atom Technology, Angstrom Technology Partnership (JRCAT-ATP), c

• Ishida M

  Sii Nanotechnology Inc.

• Ninomiya Kunimoto

  New Materials Research Center Sanyo Electric Co. Ltd.

• Ninomiya Kunimoto

  Functional Materials Research Center Sanyo Electric Co. Ltd.

• Ichikawa Masakazu

  Joint Research Center For Atom Technology

• Ichikawa Masakazu

  Joint Research Center For Atom Technology Angstrom Technology Partnership

• Ichikawa Masakazu

  Joint Research Center For Atom Technology Angstrom Technology Partnership (jrcat-atp) C

• Ichikawa Mitsuru

  Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology

• NINOMIYA Ken

  Central Research Laboratory, Hitachi, Ltd.

• Ninomiya K

  Central Research Laboratory

• Ninomiya Ken

  Central Research Laboratory Hitachi Ltd.

• HOSOKI Shigeyuki

  Central Research Laboratory, Hitachi, Ltd.

• Doi Takahisa

  Central Research Laboratory, Hitachi Ltd.

• IWASA Masayuki

  SII Nanotechnology Inc.

• Doi Takahisa

  Central Research Laboratory

• Hosoki S

  Central Research Laboratory

• Hosoki Shigeyuki

  Central Research Laboratory Hitachi Ltd.

• Iwasa Masayuki

  Sii Nanotechnology Inc. Tokyo Jpn

• NINOMIYA Ken

  Central Research Laboratory

• Hosoki Shigeyuki

  Central Research Laboratory

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