Observation of Surface Micro-Structures by Micro-Probe Reflection High-Energy Electron Diffraction
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1984-07-20
著者
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Hayakawa Kazunobu
Central Research Laboratory Hitachi Ltd
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Hayakawa Kazunobu
Central Research Laboratory Hitachi Lid.
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ICHIKAWA Masakazu
Central Research Laboratory, Hitachi Lid.
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Doi Takahisa
Central Research Laboratory, Hitachi Ltd.
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Ichihashi Mikio
Central Research Laboratory, Hitachi Ltd.
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Ichikawa Masakazu
Central Research Laboratory
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Doi Takahisa
Central Research Laboratory
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Ichihashi M
Central Research Laboratory Hitachi Ltd.
関連論文
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- Observation of 1-nm-High Structures on a Si (001) Surface Using a Differential Interference Optical Microscope
- Anisotropic Diffusion of Si Adsorbates on a Si (001) Surface
- High Dose Rate Effect of Focused-Ion-Beam Boron Implantation into Silicon
- Direct Observation of Electron Charge of Si Atoms on a Si(001) Surface
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- Micro-Probe Reflection High-Energy Electron Diffraction Technique. : I. Determination of Crystallographic Orientations of Polycrystal-Silicon Surfaces
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- Contrast Behavior of the Laue-Case Kikuchi Pattern in Reflection Electron Diffraction
- Spin Polarization due to Low-Energy Electron Diffraction at the W(001) Surface