Evaluation of fluorinated diamond like carbon as antisticking layer by scanning probe microscopy
スポンサーリンク
概要
著者
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Ishida M
Sii Nanotechnology Inc.
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Ichikawa Masakazu
Joint Research Center For Atom Technology
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Ichikawa Masakazu
Joint Research Center For Atom Technology Angstrom Technology Partnership
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Ichikawa Masakazu
Joint Research Center For Atom Technology Angstrom Technology Partnership (jrcat-atp) C
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Ichikawa Mitsuru
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Okada Makoto
Graduate School Of Science Laboratory Of Advanced Science And Technology For Industry (lasti) Univer
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IWASA Masayuki
SII Nanotechnology Inc.
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Nakamatsu Kenichiro
Graduate School Of Science Laboratory Of Advanced Science And Technology For Industry (lasti) Univer
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Nakamatsu Ken-ichiro
Laboratory Of Advanced Science And Technology For Industry (lasti) Graduate School Of Science Univer
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Iwasa Masayuki
Sii Nanotechnology Inc. Tokyo Jpn
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Okada Makoto
Univ. Hyogo Hyogo Jpn
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