Observation and nucleation control of Ge nanoislands on Si(111) surfaces using scanning reflection electron microscopy
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2000-04-01
著者
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ICHIKAWA Masakazu
Joint Research Center for Atom Technology, Angstrom Technology Partnership (JRCAT-ATP), c
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Shklyaev Alexander
Joint Research Center For Atom Technology
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Ichikawa Masakazu
Joint Research Center For Atom Technology
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SHIBATA Motoshi
Joint Research Center for Atom Technology
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