Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress
スポンサーリンク
概要
- 論文の詳細を見る
The self-improvement of static random access memory (SRAM) cell stability by post-fabrication high-voltage stress is experimentally demonstrated and its mechanism is analyzed using 4k device-matrix-array (DMA) SRAM test element group (TEG). It is shown that the stability of unbalance cells is automatically improved by merely applying stress voltage to the VDD terminal of SRAM. It is newly found that |VTH| of the OFF-state pFETs in the SRAM cell is selectively lowered which improves the cell stability and contributes to the self-improvement.
著者
-
Miyano Shinji
Semiconductor Technology Academic Research Center
-
KUMAR Anil
Institute of Industrial Science, The University of Tokyo
-
KUMAR Anil
Institute Industrial Science, The University of Tokyo
-
SARAYA Takuya
Institute Industrial Science, The University of Tokyo
-
HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
関連論文
- Random Threshold Voltage Variability Induced by Gate-Edge Fluctuations in Nanoscale Metal-Oxide-Semiconductor Field-Effect Transistors
- Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel Metal-Oxide-Semiconductor Field-Effect-Transistor ( Quantum Dot Structures)
- Fabrication of Si Nanostructures for Single Electron Device Applications by Anisotropic Etching
- Modeling of Body Factor and Subthreshold Swing in Short Channel Bulk MOSFETs
- Very Sharp Room-Temperature Negative Differential Conductance in Silicon Single-Hole Transistor with High Voltage Gain
- Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs
- High Performance Accumulated Back-Interface Dynamic Threshold SOI MOS-FET's (AB-DTMOS) with Large Body Effect at Low Supply Voltage
- Device Design of Nanoscale MOSFETs Considering the Suppression of Short Channel Effects and Characteristics Variations(Device,Low-Power, High-Speed LSIs and Related Technologies)
- Short Channel Characteristics of Variable Body Factor FD SOI MOSFETs
- Future Electron Devices and SOI Technology : Semi-Planar SOI MOSFETs with Sufficient Body Effect