Miyano Shinji | Semiconductor Technology Academic Research Center
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概要
関連著者
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Miyano Shinji
Semiconductor Technology Academic Research Center
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KUMAR Anil
Institute Industrial Science, The University of Tokyo
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SARAYA Takuya
Institute Industrial Science, The University of Tokyo
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HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
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Hiramoto Toshiro
Institute Of Industrial Science The University Of Tokyo
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Yoshimoto Masahiko
Mitsubishi Electric Corporation
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TAKAMIYA Makoto
The University of Tokyo
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TAKEUCHI Ken
The University of Tokyo
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Kawaguchi Hiroshi
Kobe Univ. Kobe‐shi Jpn
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OKUMURA Shunsuke
Kobe University
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MORITA Yasuhiro
Kobe University
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Takamiya Makoto
Institute Of Industrial Science The University Of Tokyo
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Takamiya Makoto
University Of Tokyo
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Suzuki Toshikazu
Corporate Slsi Development Div. Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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Sakurai Takayasu
University Of Tokyo
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Sakurai Takayasu
Institute Of Industrial Science The University Of Tokyo
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Kawaguchi Hiroshi
Department Of Computer Science And Systems Engineering Kobe University
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Yoshimoto Masahiko
System Lsi Development Center Mitsubishi Electric Corporation
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Yoshimoto M
Department Of Computer Science And Systems Engineering Kobe University
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Zhang Xin
The University Of Tokyo
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Takata Hidehiro
Semiconductor Technology Academic Research Center
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Pu Yu
University of Tokyo
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Zhang Xin
University of Tokyo
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Huang Jim
University of Tokyo
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Muramatsu Atsushi
Semiconductor Technology Academic Research Center
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Nomura Masahiro
Semiconductor Technology Academic Research Center
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Hirairi Koji
Semiconductor Technology Academic Research Center
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Sakurabayashi Taro
Semiconductor Technology Academic Research Center
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Takeuchi Ken
The Univ. Of Tokyo
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YOSHIMOTO Shusuke
Kobe University
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YOSHIMOTO Masahiko
JST, CREST
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Suzuki Toshikazu
Semiconductor Technology Academic Research Center (starc)
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TERADA Masaharu
Kobe University
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MIYAJI Kousuke
the University of Tokyo
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HONDA Kentaro
the University of Tokyo
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TANAKAMARU Shuhei
the University of Tokyo
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KUMAR Anil
Institute of Industrial Science, The University of Tokyo
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ALIAS Nurul
Institute Industrial Science, The University of Tokyo
著作論文
- Misleading energy and performance claims in sub/near threshold digital systems (集積回路)
- A 40-nm 0.5-V 12.9-pJ/Access 8T SRAM Using Low-Energy Disturb Mitigation Scheme
- Analysis of Operation Margin and Read Speed in 6T- and 8T-SRAM with Local Electron Injected Asymmetric Pass Gate Transistor
- Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress
- NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM