ALIAS Nurul | Institute Industrial Science, The University of Tokyo
スポンサーリンク
概要
関連著者
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ALIAS Nurul
Institute Industrial Science, The University of Tokyo
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Hiramoto Toshiro
Institute Of Industrial Science The University Of Tokyo
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Miyano Shinji
Semiconductor Technology Academic Research Center
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KUMAR Anil
Institute Industrial Science, The University of Tokyo
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SARAYA Takuya
Institute Industrial Science, The University of Tokyo
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HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
著作論文
- NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM
- Threshold voltage shifts and their variability behaviors in p-channel FETs by high voltage on-state and off-state stress