Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-03-20
著者
-
Imai S
Research Institute Of Electrical Communication Tohoku University
-
Imai Syozo
Research Institute Of Electrical Communication Tohoku University
-
SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
-
Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
-
MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
-
Imai Syozo
Research Institute Electrical Communication Tohoku University
-
Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
-
Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
-
ISHIZAKA Tatsuya
Research Institute of Electrical Communication, Tohoku University
-
Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
-
Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
-
Imai S
Kyoto Univ. Kyoto Jpn
-
Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
-
Mikoshiba Nobuo
Research Institute Of Electorical Communication Tohoku University
関連論文
- Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K
- Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction(Condensed matter: structure and mechanical and thermal properties)
- Anomalous Three-LO-Phonon Assisted Cyclotron Resonance with Spin-Flip Transitions in n-InSb
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Tetragonal-to-Orthorhombic Phase Transition and Superconductivity in the Y-Ba-Cu-O System
- Submillimeter-Wave Response of Nb-YBaCuO Point-Contact Josephson Junctions Using YBaCuO Thin Films Prepared by CVD
- Simulation of Shapiro Steps in a Josephson Junction Based on the Microscopic Theory of the Tunnel Junction
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Submillimeter-Wave Response of Nb-YBaCuO Point-Contact Josephson Junctions : Electrical Properties of Condensed Matter
- Damping Factor of the Riedel Peak in Brikge-Type Josephoson Junctions
- Frequency Dependence of the Submillimeter-Wave Response in the Tunnel-Type and Bridge-Type Josephson Junctions
- Correlation between Types of Junction and Submillimeter-Wave Responses in Point-Contact Josephson Junctions
- Frequency Dependence of the ac Josephson Effect in Nb Point Contacts in the Submillimeter-Wave Region
- Computer Simulation of Vortex Motion in a Josephson Junction Induced by Phonon Injection
- Vortex Motion in a Josephson Junction Induced by Phonon Injection
- Fluctuation Conductivity and Vortex Flow Resistivity of a Dirty Strong-Coupling Superconductor
- Flux Flow Conductivity of a Dirty Type-II Superconductor: Linear Response Theory with the Gor'kov-Eliashberg Singularity Taken into Account
- Fluctuation Conductivity and Vortex Flow Resistivity of a Dirty Strong-Coupling Superconductor
- Construction of a Scanning Tunneling Microscope for Electrochemical Studies
- Multilayer Piezoelectric Actuators for Scanning Tunneling Microscope : High Power Ultrasonics
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Growth of a Two-Dimensional Nucleus on a Cleaved(010)Surface of (NH_2CH_2COOH)_3H_2SO_4
- Time Evolution of Surface Topography arournd a Domain Wall in Ferroelectric (NH_2CH_2COOH)_3・H_2SO_4
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
- Temperature Dependence of the Inelastic Scattering Time in Metallic n-GaAs
- Determination of Physical Parameters of the Anderson Localization in Metallic n-InSb
- Effects of the Anderson Localization on Magnetoconductivity in Metallic n-GaAs
- In Situ Imaging of Electrochemical Deposition of Ag on Au(111)
- Atomic Resolution Imaging on Si(100)2 × 1 and Si(100)2 × 1 : H Surfaces with Noncontact Atomic Force Microscopy
- Voltage-Dependence of Scanning Tunneling Microscopy on Titanium Surface in Air
- Atomic Images of Disordered Regions in Graphite Crystals Obtained with Scanning Tunneling Microscope
- Atomic Corrugation of Kish Graphite in Air Measured with Scanning Tunneling Microscope
- Single Crystallization of Aluminum on SiO_2 by Thermnal Annealing and Observation with Scanning μ-RHEED Microscope
- Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI (SOLID STATE DEVICES AND MATERIALS 1)
- Theoretical Analysis for a New Package Concept : High-Speed Heat Removal for VLSI Using an AlN Heat-Spreading Layer and Microchannel Fin
- Selective Ge CVD as a Via Hole Filling Method and Self-Aligned Impurity Diffusion Microsource in Si Processing (SOLID STATE DEVICES AND MATERIALS 1)
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air
- Aluminum Nitride Epitaxially Grown on Silicon: Orientation Relationships
- In Situ Observation of Electromigration in Cu Film Using Scanning μ-Reflection High-Energy Electron Diffraction Microscope
- Planarized Deposition of High-Quality Silicon Dioxide Film by Photoassisted Plasma CVD at 300℃ Using Tetraethyl Orthosilicate
- Evaluation of LaB_6 Thin Film as Low-Work-Function Gate for MOSFET Operated at Low Temperature
- Silicon Nitride Films with Low Hydrogen Content, Low Stress, Low Damage and Stoichiometric Composition by Photo-Assisted Plasma CVD
- Temperature-Scaling Theory for Low-Temperature-Operated MOSFET with Deep-Submicron Channel : Semiconductors and Semiconductor Devices
- Pyrolysis and Photolysis of Trimethylaluminum
- Nondestructive and Noncontact Observation of Microdefects in GaAs Wafers with a New Photo-Thermal-Radiation Microscope
- Nondestructive and Noncontact Observation of Microdefects in GaAs Wafers with a New Photo-Thermal-Radiation Microscope
- Nondestructive and Noncontact Evaluation of Semiconductors by Photothermal Radiometry : Photoacoustic Spectroscopy
- Observation of Nonradiative Processes in Benzene Vapor by Photoacoustic Spectroscopy
- Quasi-Nondestructive Observation of Oxidation-Induced Stacking Faults in Silicon by Photoacoustic Topography
- Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
- Images of Barrier Layer of Anodic Aluminum Oxide in Air Obtained with Scanning Tunneling Microscope
- Phonon-Assisted Cyclotron Resonance Strongly Dependent on Surface Condition in n-InSb
- Line Shape of LO-Phonon Assisted Cyclotron Resonance in n-InSb
- Nonlinear Interaction of Surface Acoustic Waves with the Josephson Junction
- Oxide Growth of Tin Films by Modified rf Plasma Oxidation Method
- Convolution and Acoustoelectric Effect by Elastic Surface Waves in Coupled Semiconductor-Piezoelectric System
- Oscillation of Two-Dimensional Modes in Transverse-Distributed-Feedback Cavity Lasers
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Heat Capacity of Pd-Si, Ni-Si-B and Zr-Based Metallic Glasses
- Tunneling-Type Temperature Dependence of Critical Current in Nb-Sn Point Contact
- Effect of the Shunt Capacitance on the ac Josephson Effect in Nb Point Contacts
- Crossing Invariant Solution of Baryon Exchange Degeneracy and Reggeon F/D Ratios In SU(4)
- Thermoanalytical Studies on Preparation Conditions of Superconducting YBa2Cu3O7-y