Morita Seizo | Department Of Electronic Engineering Faculty Of Engineering Iwate University
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概要
関連著者
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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FUKANO Yoshinobu
Department of Physics, Faculty of Science, Hiroshima University
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Fukano Y
Department Of Physics Faculty Of Science Hiroshima University
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菅原 康弘
大阪大学大学院工学研究科 精密科学・応用物理学専攻
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Sugawara Yasuhiro
Department Of Physics Faculty Of Science Hiroshima University
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YAMANISHI Yoshiki
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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OASA Takahiko
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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Yamanishi Yoshiki
Advanced Technology Research Laboratories Sumitomo Metal Industries Ltd.
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Sugawara Yasuhiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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森田 清三
大阪大学大学院工学研究科
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OHTA Masahiro
The Second Department of Internal Medicine, Tohoku University School of Medicine
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Ohta Masahiro
Department Of Cardiology Mie University Graduate School Of Medicine
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CHAYAHARA Akiyoshi
Laboratory of Purified Materials, National Institute of Advanced Industrial Science and Technology
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ISHIZAKA Tatsuya
Research Institute of Electrical Communication, Tohoku University
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CHAYAHARA Ayumi
Department of Physics, Faculty of Science, Hiroshima University
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Chayahara Akiyoshi
Department Of Electrical Engineering Hiroshima University
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Chayahara Akiyoshi
Government Industrial Research Institute Osaka
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Ohta Masahiro
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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Ohta M
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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Ohta Tsuneaki
Optoelectronics Joint Research Laboratory
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Ohta Tuneaki
Oki Electric Industry Co. Ltd.
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Ohta Tsuneaki
Oki Electric Industry Co. Ltd.
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Ohta T
Matsushita Electric Industrial Co. Ltd. Osaka Jpn
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ABE Masayuki
Department of Pharmacokinetics and Pharmacodynamics and Global Center of Excellence (COE) Program, S
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Ohta Tsuneaki
Oki Ekectric Industry Co. Ltd.
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CHAYAHARA Akiyoshi
AIST Kansai
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ABE Masayuki
Graduate School of Engineering, Osaka University
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Igarashi M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Abe Masayuki
Graduate School Of Engineering Osaka University
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Abe Masayuki
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Ohta Takeo
Tokyo-tokushukinzoku And Co
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Imai S
Research Institute Of Electrical Communication Tohoku University
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Imai Syozo
Research Institute Of Electrical Communication Tohoku University
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Sugawara Yasuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Suzuki M
Shizuoka Univ. Hamamatsu
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Suzuki M
Department Of Electronic Engineering Faculty Of Engineering Hokkaido University
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Yokoyama Koji
School Of Science And Engineering Waseda University
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Nakano A
Hitachi Chemical Co. Ltd. Ibaraki Jpn
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Nakano Akihiko
Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)
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Nakano A
Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)
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Okada Takao
Research Institute of Biomolecule Metrology Co., Ltd
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OHTA Takayuki
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University
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Imai Syozo
Research Institute Electrical Communication Tohoku University
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NISHI Ryuji
Department of Internal Medicine, Kawasaki Medical School
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
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OKADA Takao
Olympus Optical Co., Ltd.
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Suzuki M
Sci. Univ. Tokyo Chiba Jpn
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Suzuki M
Research Center Asahi Glass Co. Ltd.
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YOKOYAMA Kousuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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UEYAMA Hitoshi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Nakano Akihiko
Vlsi Development Laboratories Ic Group Sharp Corporation
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Suzuki Mariko
Advanced Semiconductor Devices Research Laboratories R&d Center Toshiba Corporation
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Suzuki M
Research Center Sony Corporation
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SUZUKI Mineharu
NTT Interdisciplinary Research Laboratories
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Yokoyama K
Waseda Univ. Tokyo Jpn
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Nishi Ryuji
Department Of Electronic Engineering
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Okada Takao
Research Institute Of Biomolecule Metrology Co. Ltd
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Ueyama H
Nihon Koshuha Co. Ltd.
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Suzuki M
Department Of Electronics Graduate School Of Engineering Tohoku University
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Imai S
Kyoto Univ. Kyoto Jpn
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Suzuki Mitsuru
Cryogenic Centre University Of Tokyo
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ISHIKAWA Mitsuru
Joint Research Center for Atom Technology (JRCAT)
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IGARASHI Masaru
NTT Interdisciplinary Research Laboratories
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KANEKO Reizo
NTT Interdisciplinary Research Laboratories
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Ishikawa M
Institute For Solid State Physics The University Of Tokyo
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Ishikawa Mitsuo
Department Of Chemical Technology Kurashiki University Of Science And Arts
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Ozaki Toru
Department of Materials Science, Faculty of Science, Hiroshima University
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Ozaki T
Tokyo Univ. Agriculture And Technol. Tokyo Jpn
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Ozaki T
Hiroshima Univ. Higashi‐hiroshima
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Ozaki Toru
Department Of Cardiovascular Diseases Medical Biology Research Laboratories
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MISHIMA Syuzo
Olympus Optical Co., Ltd.
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OYABU Noriaki
Department of Electronic Engineering
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CUSTANCE Oscar
Handai Frontier Research Center
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UCHIHASHI Takayuki
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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ASHINO Makoto
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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SAWADA Kazuyoshi
Department of Electronic Engineering, Osaka University
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OKADA Takao
Joint Research Center for Atom Technology (JRCAT)
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NAKANO Akihiko
VLSI Development Laboratories, IC Group, Sharp Corporation
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TSUYUGUCHI Takeshi
Department of Physics, Faculty of Science, Hiroshima University
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Ohgami Junji
Department of Physics,Faculty of Science,Hiroshima University
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Osaka Fukunobu
Optoelectronics Technology Research Laboratory
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Osaka Fukunobu
Fujitsu Laboratories Ltd.
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HONTANI Kouji
Department of Physics, Faculty of Science, Hiroshima University
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NAGAOKA Hideki
Research Department, Olympus Optical Co., Ltd.
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MISHIMA Shuzo
Research Department, Olympus Optical Co., Ltd.
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Ozaki T
Institute For Solid State Physics University Of Tokyo:(present Address)ntt Basic Research Laboratori
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Ishikawa M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Okada T
Faculty Of Science Gakushuin University
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Ohgami Junji
Department Of Physics Faculty Of Science Hiroshima University
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Kaneko Reizo
Ntt Interdisciplinary Laboratories Kaneko Laboratory
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Hontani K
Department Of Physics Faculty Of Science Hiroshima University
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Ashino Makoto
Joint Research Center For Atom Technology Co National Institute For Advanced Interdisciplinary Resea
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Nagaoka Hideki
Research Department Olympus Optical Co. Ltd.
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Sawada Kazuaki
Research Institute Of Electronics Shizuoka University
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Osaka F
Optoelectronics Technology Research Lab. Ibaraki
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Ishikawa M
Toshiba Corporation Advanced Semiconductor Devices Research Laboratories
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Ida Tohru
Vlsi Development Laboratories Ic Group Sharp Corporation
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Kaneko R
Wakayama Univ. Wakayamashi Jpn
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Morita Seizo
Graduate School Of Engineering Osaka University
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Osaka F
Optoelectronics Technology Research Laboratory
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徳本 洋志
独立行政法人産業技術総合研究所
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中山 喜萬
阪大工
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KAWAMURA Hajimu
Department of Physics, Kwansei-Gakuin University
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秋田 成司
阪府大工
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Yamada Junji
Department of Pharmacotherapeutics, School of Pharmacy, Tokyo University of Pharmacy and Life Scienc
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Enomoto Yuji
Mechanical Engineering Laboratory
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Nakamura Eiji
Department Of Materials Science Faculty Of Science Hiroshima University
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Nakamura Eiji
Department Of Quantum Science And Energy Engineering Faculty Of Engineering Tohoku University
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Yamada Junji
Department Of Physics Faculty Of Science Hiroshima University
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OHKOUCHI Shunsuke
Optoelectronics Technology Research Laboratory (OTL)
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NAKANO Akihiko
Analysis Center, (IC) Group, Sharp Corpotation
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Yamada Junji
Department Of Clinical Biochemistry School Of Pharmacy Tokyo University Of Pharmacy And Life Science
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Endo Ken
Department Of Chemistry Sophia University
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Tokumoto Hiroshi
JRCAT-NAIR
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AKITA Seiji
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
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NAKAYAMA Yoshikazu
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
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TOKUMOTO Hiroshi
Electrotechmical Laboratory
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Fujisawa Satoru
Department Of Physics Faculty Of Science Hiroshima University
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Kawamura Hajimu
Department Of Applied Physics Osaka City University
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Kawamura Hajimu
Department Of Physics Osaka University Machikane Yama
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SUGIMOTO Yoshiaki
Department of Electronic Engineering
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YI Insook
Handai Frontier Research Center (FRC)
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CHOI Nami
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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TANIGAWA Masato
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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SUGAWARA Yasuhiro
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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NISHIJIMA Hidehiro
Department of Physics and Electronics, Osaka Prefecture University
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SUGAWARA Yashuhiro
Joint Research Center for Atom Technology, co National Institute for Advanced Interdisciplinary Rese
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ORISAKA Shigeki
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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ANDOH Yoshitake
Department of Electronic Engineering, Osaka University
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NAKAO Yoshizumi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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HARA Yasuyuki
Department of Electronic Engineering, Osaka University
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IDA Tohru
VLSI Development Laboratories, IC Group, Sharp Corporation
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ANDOH Yasuko
NTT Integrated Information & Energy Systems Laboratories
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KANEKO Reizo
Department of Opto-Mechatronics, Faculty of Systems Engineering, Wakayama University
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Nakao Yoshizumi
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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KISHI Eigo
Department of Physics, Faculty of Science, Hiroshima University
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Kishi Eigo
Department Of Physics Faculty Of Science Hiroshima University
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Tokumoto Hiroshi
Jrcat National Institute For Advanced Interdisciplinary Research
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Tokumoto Hiroshi
Elecltrotechnical Laboratory
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Tokumoto Hiroshi
Electrotechnical Laboratory (etl)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)-national Institute Of Advanced Industrial Science
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Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Nakamura Eiji
Department Of Electrical Engineering Faculty Of Engineering Kanagawa University
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KONISHI Takefumi
Department of Physics, Faculty of Science, Hiroshima University
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Endo K
Department Of Chemistry Sophia University
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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Nishijima Hidehiro
Department Of Physics And Electronics Osaka Prefecture University
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ENDO Katsumi
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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OCHI Taketoshi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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YOSHIMOTO Akira
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Choi N
Joint Res. Center For Atom Technol. (jrcat) Ibaraki Jpn
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Choi Nami
Department Of Chemistry University Of Tsukuba
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Choi Nami
Joint Research Center For Atom Technology (jrcat)-angstronz Technology Partnership
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金子 礼三
Wakayama University Department Of Opto-mechatronics Faculty Of Systems Engineering
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Morita Seizo
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Morita Seizo
Department Of Physics Osaka University Machikane Yama:(present Address) Research Institute Of Electr
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Hara Yasuyuki
Department Of Electronic Engineering Osaka University
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TAKANO Shuzo
Department of Physics,Kyushu University
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Yoshimoto Akira
Department Of Biological Sciences Graduate School Of Bioscience And Biotechnology Tokyo Institute Of
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SUGIMOTO Yoshiaki
Graduate School of Engineering, Osaka University
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Nakamura E
Department Of Quantum Science And Energy Engineering Faculty Of Engineering Tohoku University
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Fujisawa Shunzo
Department Of Physics Faculty Of Science Hiroshima University
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HONTANI Koji
Department of Physics, Faculty of Science, Hiroshima University
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IDA Toru
VLSI Development Laboratories, IC Group, Sharp Corporation
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IDA Tohru
Analysis Center, VLSI Development Laboratories, IC Group, Sharp Corporation
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KUMAGAI Kozo
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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Konishi T
Department Of Chemistry And Biochemistry Graduate School Of Engineering Kyushu University And "
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Andoh Yoshitake
Department Of Electronic Engineering Osaka University
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Kumagai K
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Ochi Taketoshi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Yoshimoto Akira
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Sugimoto Yoshiaki
Graduate School Of Engineering Osaka University
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Takano Shuzo
Department Of Computer And Electronics Kyushu Institute Of Techonology
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Takano Shuzo
Department Of Physics Osaka University Machikane Yama:(present Address) Department Of Physics Kyushu
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Enomoto Y
Mechanical Engineering Lab. Tsukuba Jpn
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Hontani Koji
Department Of Physics Faculty Of Science Hiroshima University
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SUEHIRA Nobuhito
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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MAITA Yutaka
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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TAKAHASHI Yoshiaki
Research Institute of Electrical Communication, Tohoku University
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Nakano Akihiko
Analysis Center (ic) Group Sharp Corpotation
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Tanigawa Masato
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership(atp)
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Maita Yutaka
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Akita Shirabe
Central Research Institute Of Electric Power Industry
著作論文
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Growth of a Two-Dimensional Nucleus on a Cleaved(010)Surface of (NH_2CH_2COOH)_3H_2SO_4
- Time Evolution of Surface Topography arournd a Domain Wall in Ferroelectric (NH_2CH_2COOH)_3・H_2SO_4
- Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
- In Situ Imaging of Electrochemical Deposition of Ag on Au(111)
- Atomic Resolution Imaging on Si(100)2 × 1 and Si(100)2 × 1 : H Surfaces with Noncontact Atomic Force Microscopy
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air
- Line Shape of LO-Phonon Assisted Cyclotron Resonance in n-InSb
- Scanning Tunneling Potentiometry/Spectroscopy (STP/STS)
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]
- Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Effect of Potentiostatic Control on in situ STM Images of Ag and Au Electrodes in a 0.1 M KCl Solution