Sugawara Yasuhiro | Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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概要
- SUGAWARA Yasuhiroの詳細を見る
- 同名の論文著者
- Deparment Of Electrical Engineering Faculty Of Engineering Tohoku Universityの論文著者
関連著者
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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FUKANO Yoshinobu
Department of Physics, Faculty of Science, Hiroshima University
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Fukano Y
Department Of Physics Faculty Of Science Hiroshima University
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YAMANISHI Yoshiki
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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OASA Takahiko
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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Yamanishi Yoshiki
Advanced Technology Research Laboratories Sumitomo Metal Industries Ltd.
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Sugawara Yasuhiro
Department Of Physics Faculty Of Science Hiroshima University
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菅原 康弘
大阪大学大学院工学研究科 精密科学・応用物理学専攻
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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Sugawara Yasuhiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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OHTA Masahiro
The Second Department of Internal Medicine, Tohoku University School of Medicine
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Ohta Masahiro
Department Of Cardiology Mie University Graduate School Of Medicine
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Naitoh Yoshitaka
Department Of Applied Chemistry Graduate School Of Engineering Osaka University
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Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Ohta Masahiro
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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Ohta M
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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CHAYAHARA Akiyoshi
Laboratory of Purified Materials, National Institute of Advanced Industrial Science and Technology
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ISHIZAKA Tatsuya
Research Institute of Electrical Communication, Tohoku University
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CHAYAHARA Ayumi
Department of Physics, Faculty of Science, Hiroshima University
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Chayahara Akiyoshi
Department Of Electrical Engineering Hiroshima University
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Chayahara Akiyoshi
Government Industrial Research Institute Osaka
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MORITA Seizo
Laboratories of Crystal Physics, Faculty of Science, Hiroshima University
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Ohta Tsuneaki
Optoelectronics Joint Research Laboratory
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Ohta Tuneaki
Oki Electric Industry Co. Ltd.
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Ohta Tsuneaki
Oki Electric Industry Co. Ltd.
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Ohta T
Matsushita Electric Industrial Co. Ltd. Osaka Jpn
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森田 清三
大阪大学大学院工学研究科
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ABE Masayuki
Department of Pharmacokinetics and Pharmacodynamics and Global Center of Excellence (COE) Program, S
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Nomura Hikaru
Department Of Applied Physics Graduate School Of Engineering Osaka University
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UEYAMA Hitoshi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Ohta Tsuneaki
Oki Ekectric Industry Co. Ltd.
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CHAYAHARA Akiyoshi
AIST Kansai
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Ueyama H
Nihon Koshuha Co. Ltd.
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ABE Masayuki
Graduate School of Engineering, Osaka University
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Abe Masayuki
Graduate School Of Engineering Osaka University
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Abe Masayuki
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Ohta Takeo
Tokyo-tokushukinzoku And Co
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Imai S
Research Institute Of Electrical Communication Tohoku University
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Imai Syozo
Research Institute Of Electrical Communication Tohoku University
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Sugawara Yasuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Suzuki M
Shizuoka Univ. Hamamatsu
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Suzuki M
Department Of Electronic Engineering Faculty Of Engineering Hokkaido University
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Nakano A
Hitachi Chemical Co. Ltd. Ibaraki Jpn
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Nakano Akihiko
Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)
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Nakano A
Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)
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Okada Takao
Research Institute of Biomolecule Metrology Co., Ltd
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OHTA Takayuki
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University
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Imai Syozo
Research Institute Electrical Communication Tohoku University
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NISHI Ryuji
Department of Internal Medicine, Kawasaki Medical School
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
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Ozaki Toru
Department of Materials Science, Faculty of Science, Hiroshima University
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Ozaki T
Tokyo Univ. Agriculture And Technol. Tokyo Jpn
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Ozaki T
Hiroshima Univ. Higashi‐hiroshima
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Ozaki Toru
Department Of Cardiovascular Diseases Medical Biology Research Laboratories
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Suzuki M
Sci. Univ. Tokyo Chiba Jpn
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Suzuki M
Research Center Asahi Glass Co. Ltd.
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Fujisawa Satoru
Department Of Physics Faculty Of Science Hiroshima University
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Ohgami Junji
Department of Physics,Faculty of Science,Hiroshima University
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Nakano Akihiko
Vlsi Development Laboratories Ic Group Sharp Corporation
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Suzuki Mariko
Advanced Semiconductor Devices Research Laboratories R&d Center Toshiba Corporation
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Suzuki M
Research Center Sony Corporation
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SUZUKI Mineharu
NTT Interdisciplinary Research Laboratories
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Ozaki T
Institute For Solid State Physics University Of Tokyo:(present Address)ntt Basic Research Laboratori
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Nishi Ryuji
Department Of Electronic Engineering
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Okada Takao
Research Institute Of Biomolecule Metrology Co. Ltd
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Ohgami Junji
Department Of Physics Faculty Of Science Hiroshima University
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Suzuki M
Department Of Electronics Graduate School Of Engineering Tohoku University
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Imai S
Kyoto Univ. Kyoto Jpn
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LI Yan
Department of Histology and Embryology, Zhongshan School of Medicine, Sun Yat-sen University
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Li Yan
Department Of Dermatology Affiliated Union Hospital Tongji Medical College Huazhong University Of Sc
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NAITOH Yoshitaka
Department of Applied Physics, Graduate School of Engineering, Osaka University
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KAGESHIMA Masami
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Naitoh Yoshitaka
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Li Yan
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Nakamura Eiji
Department Of Materials Science Faculty Of Science Hiroshima University
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Nakamura Eiji
Department Of Quantum Science And Energy Engineering Faculty Of Engineering Tohoku University
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Suzuki Mitsuru
Cryogenic Centre University Of Tokyo
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IGARASHI Masaru
NTT Interdisciplinary Research Laboratories
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KANEKO Reizo
NTT Interdisciplinary Research Laboratories
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OKADA Takao
Olympus Optical Co., Ltd.
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MISHIMA Syuzo
Olympus Optical Co., Ltd.
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OYABU Noriaki
Department of Electronic Engineering
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CUSTANCE Oscar
Handai Frontier Research Center
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SAWADA Kazuyoshi
Department of Electronic Engineering, Osaka University
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OKADA Takao
Joint Research Center for Atom Technology (JRCAT)
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NAKANO Akihiko
VLSI Development Laboratories, IC Group, Sharp Corporation
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TSUYUGUCHI Takeshi
Department of Physics, Faculty of Science, Hiroshima University
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Osaka Fukunobu
Optoelectronics Technology Research Laboratory
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Osaka Fukunobu
Fujitsu Laboratories Ltd.
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Nakamura Eiji
Department Of Electrical Engineering Faculty Of Engineering Kanagawa University
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HONTANI Kouji
Department of Physics, Faculty of Science, Hiroshima University
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NAGAOKA Hideki
Research Department, Olympus Optical Co., Ltd.
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MISHIMA Shuzo
Research Department, Olympus Optical Co., Ltd.
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Okada T
Faculty Of Science Gakushuin University
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Kaneko Reizo
Ntt Interdisciplinary Laboratories Kaneko Laboratory
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Hontani K
Department Of Physics Faculty Of Science Hiroshima University
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Nagaoka Hideki
Research Department Olympus Optical Co. Ltd.
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Sawada Kazuaki
Research Institute Of Electronics Shizuoka University
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Nakamura E
Department Of Quantum Science And Energy Engineering Faculty Of Engineering Tohoku University
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Fujisawa Shunzo
Department Of Physics Faculty Of Science Hiroshima University
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Osaka F
Optoelectronics Technology Research Lab. Ibaraki
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Igarashi M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Ida Tohru
Vlsi Development Laboratories Ic Group Sharp Corporation
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Kaneko R
Wakayama Univ. Wakayamashi Jpn
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Morita Seizo
Graduate School Of Engineering Osaka University
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Osaka F
Optoelectronics Technology Research Laboratory
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大久保 修平
東京大学地震研究所
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大久保 修平
東大震研
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MORITA Seizo
Handai Frontier Research Center
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Honda Masaki
Department Of Anatomy Nihon University School Of Dentistry
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Kato Aitaro
Univ. Tokyo Tokyo Jpn
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MOMOTANI Kohji
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Yamada Junji
Department of Pharmacotherapeutics, School of Pharmacy, Tokyo University of Pharmacy and Life Scienc
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Kato Aitaro
Earthquake Research Institute University Of Tokyo
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Enomoto Yuji
Mechanical Engineering Laboratory
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Momotani Kohji
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Yokoyama Koji
School Of Science And Engineering Waseda University
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Yamada Junji
Department Of Physics Faculty Of Science Hiroshima University
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Inoue Akihisa
Institute For Materials Research
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MASUMOTO Tsuyoshi
The Research Institute of Electrical and Magnetic Materials
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OHKOUCHI Shunsuke
Optoelectronics Technology Research Laboratory (OTL)
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SUGANO Takayuki
Earthquake Research Institute, University of Tokyo
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NAKANO Akihiko
Analysis Center, (IC) Group, Sharp Corpotation
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Masumoto T
The Research Institute Of Electrical And Magnetic Materials
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Kanomata Takeshi
Department Of Applied Physics Faculty Of Engineering Tohoku Gakuin University
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Yamada Junji
Department Of Clinical Biochemistry School Of Pharmacy Tokyo University Of Pharmacy And Life Science
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Endo Ken
Department Of Chemistry Sophia University
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Chubachi Noriyoshi
Department of Electrical Engineering,Faculty of Engineering,Tohoku University
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Kimura Hisamichi
Institute For Material Research Tohoku University
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KUSHIBIKI Jun-ichi
Department of Electrical Engineering, Tohoku University
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SUGIMOTO Yoshiaki
Department of Electronic Engineering
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YI Insook
Handai Frontier Research Center (FRC)
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YOKOYAMA Kousuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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ORISAKA Shigeki
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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ANDOH Yoshitake
Department of Electronic Engineering, Osaka University
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NAKAO Yoshizumi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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HARA Yasuyuki
Department of Electronic Engineering, Osaka University
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IDA Tohru
VLSI Development Laboratories, IC Group, Sharp Corporation
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ANDOH Yasuko
NTT Integrated Information & Energy Systems Laboratories
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KANEKO Reizo
Department of Opto-Mechatronics, Faculty of Systems Engineering, Wakayama University
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Nakao Yoshizumi
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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SUWAWARA Yasuhiro
Department of Physics, Faculty of Science, Hiroshima University
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KISHI Eigo
Department of Physics, Faculty of Science, Hiroshima University
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Kishi Eigo
Department Of Physics Faculty Of Science Hiroshima University
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KONISHI Takefumi
Department of Physics, Faculty of Science, Hiroshima University
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Endo K
Department Of Chemistry Sophia University
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ENDO Katsumi
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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Yokoyama K
Waseda Univ. Tokyo Jpn
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OCHI Taketoshi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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YOSHIMOTO Akira
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Sato Yuka
Department Of Applied Physics Faculty Of Engineering Tohoku Gakuin University
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金子 礼三
Wakayama University Department Of Opto-mechatronics Faculty Of Systems Engineering
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Morita Seizo
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Hara Yasuyuki
Department Of Electronic Engineering Osaka University
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Furuya Masato
Department Of Earth And Planetary Physics The University Of Tokyo
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Yoshimoto Akira
Department Of Biological Sciences Graduate School Of Bioscience And Biotechnology Tokyo Institute Of
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SUGIMOTO Yoshiaki
Graduate School of Engineering, Osaka University
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大久保 修平
東京大
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Kaneko Takejiro
Institute For Materials Reseach Tohoku University
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HONTANI Koji
Department of Physics, Faculty of Science, Hiroshima University
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IDA Toru
VLSI Development Laboratories, IC Group, Sharp Corporation
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IDA Tohru
Analysis Center, VLSI Development Laboratories, IC Group, Sharp Corporation
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KUMAGAI Kozo
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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Chubachi Noriyoshi
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Konishi T
Department Of Chemistry And Biochemistry Graduate School Of Engineering Kyushu University And "
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Andoh Yoshitake
Department Of Electronic Engineering Osaka University
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Kumagai K
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Ochi Taketoshi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Yoshimoto Akira
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Sugimoto Yoshiaki
Graduate School Of Engineering Osaka University
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Sun Wenke
Earthquake Research Institute University Of Tokyo
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Okubo Shuhei
Earthquake Research Institute University Of Tokyo
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Masumoto Tsuyoshi
Institute For Materials Research
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Kushibiki Jun-ichi
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Enomoto Y
Mechanical Engineering Lab. Tsukuba Jpn
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Hontani Koji
Department Of Physics Faculty Of Science Hiroshima University
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ABURATANI Shigeyuki
Department of Applied Physics, Faculty of Engineering, Tohoku Gakuin University
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SUEHIRA Nobuhito
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Faculty Of Engineering Tohoku Gakuin University
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Aburatani Shigeyuki
Department Of Applied Physics Faculty Of Engineering Tohoku Gakuin University
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Nakano Akihiko
Analysis Center (ic) Group Sharp Corpotation
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大久保 修平
Earthquake Research Institute University Of Tokyo
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Sun Wenke
College Of Earth Science Graduate University Of Chinese Academy Of Sciences
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Furuya Masato
Department Of Natural History Sciences Graduate School Of Science Hokkaido University
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Furuya Masato
Department Of Natural History Sciences Hokkaido University
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TANAKA Yoshiyuki
Earthquake Research Institute, University of Tokyo
著作論文
- Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K
- Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction(Condensed matter: structure and mechanical and thermal properties)
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Growth of a Two-Dimensional Nucleus on a Cleaved(010)Surface of (NH_2CH_2COOH)_3H_2SO_4
- Time Evolution of Surface Topography arournd a Domain Wall in Ferroelectric (NH_2CH_2COOH)_3・H_2SO_4
- Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
- In Situ Imaging of Electrochemical Deposition of Ag on Au(111)
- Atomic Resolution Imaging on Si(100)2 × 1 and Si(100)2 × 1 : H Surfaces with Noncontact Atomic Force Microscopy
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air
- Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Heat Capacity of Pd-Si, Ni-Si-B and Zr-Based Metallic Glasses
- Gravity changes observed between 2004 and 2009 near the Tokai slow-slip area and prospects for detecting fluid flow during future slow-slip events
- Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]
- Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy
- Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K
- High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy
- High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
- Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K
- The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping