Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K
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概要
- 論文の詳細を見る
A new atomic force microscopy (AFM) force mapping technique has been used to investigate insulating thin (100) films of NaCl on conducting Cu(111) substrate at 78 K. This technique was able to map the interaction forces between the AFM tip and the surface ions of the sample. The site-specific force curves of the (100) surface of the NaCl thin films are presented. We observed only an attractive short-range interaction force at the Na+ and Cl- sites. We propose simple models to explain the behavior of the force curves at the different ion sites.
- 2012-03-25
著者
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Naitoh Yoshitaka
Department Of Applied Chemistry Graduate School Of Engineering Osaka University
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Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Li Yan
Department Of Applied Chemistry Graduate School Of Engineering Kyushu University
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Li Yan
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Kinoshita Yukinori
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Tenjin Keita
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Ma Zong
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Kou Li
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Sugawara Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Kageshima Masami
Department of Physics, Tokyo Gakugei University, Koganei, Tokyo 184-8501, Japan
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Naitoh Yoshitaka
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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