Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
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概要
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By carrying out a fast line scan 10° tilted from perpendicular to a row of the stick-points on a cleaved graphite surface, we observed localized fluctuation of a two-dimensional atomic-scale friction using a two-dimensional frictional force microscope. The analysis which was based on a two-dimensional stick-slip model revealed that the localized fluctuation on an atomic scale exhibits three kinds of tip trajectory and that one trajectory exhibits a slip motion with an almost 90° angle from the fast line scan direction. This localized fluctuation enabled us to observe square-wave signal with a subangstrom lateral width which indicates the achievement of subangstrom lateral resolution with a microscope for the first time. Furthermore, the origin of the three possible trajectories was explained well by an extended two-dimensional stick-slip model with the effective adhesive area. Therefore, this extended model is useful for studying the origin of the fluctuation of an atomic-scale friction.
- 1996-11-15
著者
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Fujisawa Satoru
Department Of Physics Faculty Of Science Hiroshima University
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MORITA Seizo
Laboratories of Crystal Physics, Faculty of Science, Hiroshima University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Morita Seizo
Laboratory of Crystal Physics, Faculty of Science, Hiroshima University,
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Fujisawa Satoru
Department of Physics, Faculty of Science, Hiroshima University,
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Sugawara Yasuhiro
Department of Physics, Faculty of Science, Hiroshima University,
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