Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy
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概要
- 論文の詳細を見る
We observe the B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ surface by noncontact atomic force microscopy (NC-AFM) with atomic resolution. Two types of spot (dim and bright spots) appear in AFM images. The dim spots correspond to the B-S5 structure where the subsurface atom is the B atom, while the bright spots correspond to the Si-T4 structure where the sub-surface atom is the Si atom. By NC-AFM, we successfully determine the difference between the atom species under the surface, such as Si and B atoms.
- 2008-10-25
著者
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Naitoh Yoshitaka
Department Of Applied Chemistry Graduate School Of Engineering Osaka University
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Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Li Yan
Department Of Applied Chemistry Graduate School Of Engineering Kyushu University
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Li Yan
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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Kinoshita Masaharu
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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