Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-11-15
著者
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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YAMANISHI Yoshiki
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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OASA Takahiko
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Yamanishi Yoshiki
Advanced Technology Research Laboratories Sumitomo Metal Industries Ltd.
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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