Uchihashi Takayuki | Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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概要
関連著者
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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YAMANISHI Yoshiki
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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OASA Takahiko
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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Yamanishi Yoshiki
Advanced Technology Research Laboratories Sumitomo Metal Industries Ltd.
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FUKANO Yoshinobu
Department of Physics, Faculty of Science, Hiroshima University
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Fukano Y
Department Of Physics Faculty Of Science Hiroshima University
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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CHAYAHARA Akiyoshi
Laboratory of Purified Materials, National Institute of Advanced Industrial Science and Technology
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CHAYAHARA Ayumi
Department of Physics, Faculty of Science, Hiroshima University
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Chayahara Akiyoshi
Department Of Electrical Engineering Hiroshima University
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Chayahara Akiyoshi
Government Industrial Research Institute Osaka
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Igarashi M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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CHAYAHARA Akiyoshi
AIST Kansai
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森田 清三
大阪大学大学院工学研究科
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菅原 康弘
大阪大学大学院工学研究科 精密科学・応用物理学専攻
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Sugawara Yasuhiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Sugawara Yasuhiro
Department Of Physics Faculty Of Science Hiroshima University
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ISHIKAWA Mitsuru
Joint Research Center for Atom Technology (JRCAT)
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Ishikawa M
Institute For Solid State Physics The University Of Tokyo
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Ishikawa Mitsuo
Department Of Chemical Technology Kurashiki University Of Science And Arts
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UCHIHASHI Takayuki
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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Ishikawa M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Ishikawa M
Toshiba Corporation Advanced Semiconductor Devices Research Laboratories
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Ishikawa Mitsuru
Joint Research Center For Atom Technology
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徳本 洋志
独立行政法人産業技術総合研究所
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中山 喜萬
阪大工
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秋田 成司
阪府大工
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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Yokoyama Koji
School Of Science And Engineering Waseda University
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Nakano A
Hitachi Chemical Co. Ltd. Ibaraki Jpn
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Nakano Akihiko
Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)
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Nakano A
Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)
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IGARASHI Masaru
NTT Interdisciplinary Research Laboratories
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KANEKO Reizo
NTT Interdisciplinary Research Laboratories
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Tokumoto Hiroshi
JRCAT-NAIR
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AKITA Seiji
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
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NAKAYAMA Yoshikazu
Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University
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TOKUMOTO Hiroshi
Electrotechmical Laboratory
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CHOI Nami
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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ASHINO Makoto
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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NISHIJIMA Hidehiro
Department of Physics and Electronics, Osaka Prefecture University
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YOKOYAMA Kousuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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NAKANO Akihiko
VLSI Development Laboratories, IC Group, Sharp Corporation
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TSUYUGUCHI Takeshi
Department of Physics, Faculty of Science, Hiroshima University
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Tokumoto Hiroshi
Jrcat National Institute For Advanced Interdisciplinary Research
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Tokumoto Hiroshi
Elecltrotechnical Laboratory
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Tokumoto Hiroshi
Electrotechnical Laboratory (etl)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science
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Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)-national Institute Of Advanced Industrial Science
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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Nakayama Yoshikazu
Department Of Electrical Engineering College Of Engineering University Of Osaka
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Nakano Akihiko
Vlsi Development Laboratories Ic Group Sharp Corporation
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Akita Seiji
Department Of Physics And Electronics College Of Engineering University Of Osaka Prefecture
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Nishijima Hidehiro
Department Of Physics And Electronics Osaka Prefecture University
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Yokoyama K
Waseda Univ. Tokyo Jpn
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Choi N
Joint Res. Center For Atom Technol. (jrcat) Ibaraki Jpn
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Choi Nami
Department Of Chemistry University Of Tsukuba
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Choi Nami
Joint Research Center For Atom Technology (jrcat)-angstronz Technology Partnership
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Kaneko Reizo
Ntt Interdisciplinary Laboratories Kaneko Laboratory
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Ashino Makoto
Joint Research Center For Atom Technology Co National Institute For Advanced Interdisciplinary Resea
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Kaneko R
Wakayama Univ. Wakayamashi Jpn
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Tsuyuguchi Takeshi
Department Of Physics Faculty Of Science Hiroshima University
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OHTA Masahiro
The Second Department of Internal Medicine, Tohoku University School of Medicine
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ABE Masayuki
Department of Pharmacokinetics and Pharmacodynamics and Global Center of Excellence (COE) Program, S
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Ohta Masahiro
Department Of Cardiology Mie University Graduate School Of Medicine
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Yamada Junji
Department of Pharmacotherapeutics, School of Pharmacy, Tokyo University of Pharmacy and Life Scienc
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Ishida Tadashi
National Institute Of Advanced Industrial Science And Technology
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Okada Takao
Research Institute of Biomolecule Metrology Co., Ltd
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Yamada Junji
Department Of Physics Faculty Of Science Hiroshima University
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Yamada Junji
Department Of Clinical Biochemistry School Of Pharmacy Tokyo University Of Pharmacy And Life Science
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Ishida Toshimasa
Research Laboratory Oki Electric Industry Co. Lid
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Ishida Takayuki
Department Of Radiology National Federation Of Health Insurance Societies Osaka Chuo Hospital
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Ishida T
Department Of Physics Faculty Of Science Ibaraki University
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TANIGAWA Masato
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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SUGAWARA Yasuhiro
Joint Research Center for Atom Technology(JRCAT), Angstrom Technology Partnership(ATP)
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SUGAWARA Yashuhiro
Joint Research Center for Atom Technology, co National Institute for Advanced Interdisciplinary Rese
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ORISAKA Shigeki
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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IDA Tohru
VLSI Development Laboratories, IC Group, Sharp Corporation
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UEYAMA Hitoshi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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MORITA Seizo
Laboratories of Crystal Physics, Faculty of Science, Hiroshima University
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ISHIDA Takao
JRCAT, National Institute for Advanced Interdisciplinary Research
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MIZUTANI Wataru
JRCAT, National Institute for Advanced Interdisciplinary Research
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Okada Takao
Research Institute Of Biomolecule Metrology Co. Ltd
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金子 礼三
Wakayama University Department Of Opto-mechatronics Faculty Of Systems Engineering
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Ohta Masahiro
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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Ueyama H
Nihon Koshuha Co. Ltd.
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ABE Masayuki
Graduate School of Engineering, Osaka University
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HONTANI Koji
Department of Physics, Faculty of Science, Hiroshima University
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IDA Toru
VLSI Development Laboratories, IC Group, Sharp Corporation
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Ida Tohru
Vlsi Development Laboratories Ic Group Sharp Corporation
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Ohta M
The Second Department Of Internal Medicine Tohoku University School Of Medicine
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Abe Masayuki
Graduate School Of Engineering Osaka University
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Hontani Koji
Department Of Physics Faculty Of Science Hiroshima University
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Abe Masayuki
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Tanigawa Masato
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership(atp)
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Akita Shirabe
Central Research Institute Of Electric Power Industry
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Mizutani W
National Inst. Advanced Ind. Sci. And Technol. Ibaraki Jpn
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Okada Takao
Research Department R&d Division Taki Chemical Co. Ltd.
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Abe Masayuki
Department Of Applied Biological Chemistry Faculty Of Agriculture Tohoku University
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Orisaka Shigeki
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Tanigawa Masato
Joint Research Center for Atom Technology
著作論文
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator