Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1994-07-01

著者

• SUGAWARA Yasuhiro

  Department of Applied Physics, Graduate School of Engineering, Osaka University

• Sugawara Yasuhiro

  Department Of Applied Physics Graduate School Of Engineering Osaka University

• Uchihashi Takayuki

  Department of Physics, Kanazawa University

• Ida T

  Inst. Physical And Chemical Res. (riken) Saitama Jpn

• Okada T

  Joint Research Center For Atom Technology (jrcat)

• Nakano A

  Hitachi Chemical Co. Ltd. Ibaraki Jpn

• Nakano Akihiko

  Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)

• Nakano A

  Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)

• OKUSAKO Takahiro

  Department of Physics, Faculty of Science, Hiroshima University

• MORITA Seizo

  Department of Physics, Faculty of Science, Hiroshima University

• Ohta Takayuki

  Department Of Electronic Engineering Faculty Of Engineering Osaka University

• NAKANO Akihiko

  VLSI Development Laboratories, IC Group, Sharp Corporation

• Ishizaka Tatsuya

  Research Institute Of Electrical Communication Tohoku University

• Uchihashi Takayuki

  Jrcat-angstrom Technology Partnership (atp)

• Uchihashi Takayuki

  Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.

• Nakano Akihiko

  Vlsi Development Laboratories Ic Group Sharp Corporation

• Morita Seizo

  Department Of Electronic Engineering Faculty Of Engineering Iwate University

• IDA Toru

  VLSI Development Laboratories, IC Group, Sharp Corporation

• Uchihashi Takayuki

  Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership

• Sugawara Yasuhiro

  Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University

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