Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-08-07
著者
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Chubachi Noriyoshi
Department of Electrical Engineering,Faculty of Engineering,Tohoku University
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KUSHIBIKI Jun-ichi
Department of Electrical Engineering, Tohoku University
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Chubachi Noriyoshi
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Kushibiki Jun-ichi
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
関連論文
- Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K
- Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction(Condensed matter: structure and mechanical and thermal properties)
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- A technique of measuring relative sound velocity changes using a frequency variable type ultrasonic correlation system
- Measurement of Ultrasonic Velocity in Liquid Using a Modified Ultrasonic Correlation System Under Low S/N Condition : Acoustical Measurements and Instrumentation
- Velocity Measurement in Liquids by using Reflection Type Ultrasonic Correlator via Wave number Analysis in MHz Range : Physical Acoustics
- Homogeneous TiO_2-SiO_2 Ultralow-Expansion Glass for Extreme Ultraviolet Lithography Evaluated by the Line-Focus-Beam Ultrasonic Material Characterization System
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Measurement and Analysis of Vibrations on Surface of Phantom Induced by Piezoelectric Extracorporeal Shock Wave Lithotripter
- Power Difference in Spectrum of Sound Radiation before and after Break of Phantom by Piezoelectric Extracorporeal Shock Wave Lithotriptor
- Growth of a Two-Dimensional Nucleus on a Cleaved(010)Surface of (NH_2CH_2COOH)_3H_2SO_4
- Time Evolution of Surface Topography arournd a Domain Wall in Ferroelectric (NH_2CH_2COOH)_3・H_2SO_4
- Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
- In Situ Imaging of Electrochemical Deposition of Ag on Au(111)
- Atomic Resolution Imaging on Si(100)2 × 1 and Si(100)2 × 1 : H Surfaces with Noncontact Atomic Force Microscopy
- Evaluation of Piezoelectric Ceramic Substrates for Ultrasonic Bulk Wave Filters and Resonators Using Pulse Interference Method
- High-Resolution Determination of Transit Time of Ultrasound in a Thin Layer in Pulse-Echo Method
- A new method to measure bone properties by means of leaky surface acoustic waves
- Homogeneity Evaluation of LiNbO_3 and LiTaO_3 Single Crystals for Determining Acoustical Physical Constants
- Transmission Line Model Equivalent Circuit for Piezoelectric Transducers Including the Effect of Electrical Terminal Impedance
- A Basic Study on Nondestructive Evaluation of Potatoes Using Ultrasound : Acoustical Measurements and Instrumentation
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air
- Chemical Isotropic Etching of Single-Crystal Silicon for Acoustic Lens of Scanning Acoustic Microscope
- Mechanically Scanned Acoustic Microscope
- A Super-Precise CTE Evaluation Method for Ultra-Low-Expansion Glasses Using the LFB Ultrasonic Material Characterization System
- A Promising Evaluation Method of Ultra-Low-Expansion Glasses for the Extreme Ultra-Violet Lithography System by the Line-Focus-Beam Ultrasonic Material Characterization System
- F-2 A Super-Precision Evaluation Method of CTE for Ultra-Low Expansion Glasses Using the LFB Ultrasonic Material Characterization System(Measurement techniques, Imaging, Nondestructive testing)
- Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
- Scanning Nonlinear Dielectric Microscope with Submicron Resolution
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Heat Capacity of Pd-Si, Ni-Si-B and Zr-Based Metallic Glasses
- A Super-Precise CTE Evaluation Method for Ultra-Low-Expansion Glasses Using the LFB Ultrasonic Material Characterization System
- Development of a Micro Line-Focus-Beam Ultrasonic Device
- A Promising Method of Evaluating ZnO Single Crystals Using the Line-Focus-Beam Ultrasonic Material-Characterization System
- Precise Velocity Measurements for Thin Specimens by Line-Focus-Beam Acoustic Microscopy
- Non-Contact Simultaneous Measurement of Thickness and Acoustic Properties of a Biological Tissue Using Focused Wave in a Scanning Acoustic Microscope : Medical Ultrasonics and Ultrasonic Measurements
- Propagation Properties of Ultrasound in Acoustic Microscopy through a Double-Layered Specimen Consisting of Thin Biological Tissue and Its Holder : Ultrasonic Imaging and Microscopy
- Gravity changes observed between 2004 and 2009 near the Tokai slow-slip area and prospects for detecting fluid flow during future slow-slip events
- A Remote Measurement Method of Acoustic Velocity in Liquids by a Pair of Leaky Rayleigh Waveguides : Acoustical Measurements and Instrumentation
- Scanning Acoustic Microscope Employing Concave Ultrasonic Transducers : Physical Acoustics I
- Ultrasonic Microspectroscopy Measurement of Fictive Temperature for Synthetic Silica Glass
- A New Ultrasonic Amplifier Device of CdS Crystal with Integrated Diffusion-Layer Transducers
- Theoretical and Experimental Considerations on Line-Focus-Beam Acoustic Microscopy for Thin Specimens
- Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]
- Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer
- Measurements of Acoustic Properties of Teeth by Impulsive-Wave Acoustic Microscope System : Medical Ultrasonics
- Characterization of Domain-Inverted Layers in LiTaO_3 by Line-Focus-Beam Acoustic Microscopy
- Line-Focus-Beam Acoustic Microscopy Detection of Variations of Growing Conditions of LiTaO_3 Crystals
- Correction of Velocity Profiles on Thin Specimens Measured by Line-Focus-Beam Acoustic Microscopy
- Ultrasonic Micro-Spectroscopy of Synthetic Sapphire Crystals
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Experimental Study for Evaluating Striae Structure of TiO2–SiO2 Glasses Using the Line-Focus-Beam Ultrasonic Material Characterization System
- Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy
- Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K
- Super-Accurate Velocity Measurement for Evaluating TiO2–SiO2 Ultra-Low-Expansion Glass Using the Line-Focus-Beam Ultrasonic Material Characterization System
- Improvement of Velocity Measurement Accuracy of Leaky Surface Acoustic Waves for Materials with Highly Attenuated Waveform of the $\mathrm{V}(z)$ curve by the Line-Focus-Beam Ultrasonic Material Characterization System
- High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy
- Piezoelectric Properties of Ca3NbGa3Si2O14 Single Crystal
- Ultrasonic Microspectroscopy of ZnO Single Crystals Grown by the Hydrothermal Method
- Accurate Calibration Line for Super-Precise Coefficient of Thermal Expansion Evaluation Technology of TiO2-Doped SiO2 Ultra-Low-Expansion Glass Using the Line-Focus-Beam Ultrasonic Material Characterization System
- A Promising Evaluation Method of Ultra-Low-Expansion Glasses for the Extreme Ultra-Violet Lithography System by the Line-Focus-Beam Ultrasonic Material Characterization System
- Accurate Velocity Measurement of Periodic Striae of TiO2–SiO2 Glasses by the Line-Focus-Beam Ultrasonic Material-Characterization System