Scanning Nonlinear Dielectric Microscope with Submicron Resolution
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概要
- 論文の詳細を見る
A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.
- 社団法人応用物理学会の論文
- 1998-05-30
著者
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CHO Yasuo
Research Institute of Electrical Communication, Tohoku University
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KUSHIBIKI Jun-ichi
Department of Electrical Engineering, Tohoku University
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MATSUURA Kaori
Department of Electrical Communication, Faculty of Engineering, Tohoku University
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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Matsuura Kaori
Department Of Electrical And Electronics Engineering Faculty Of Engineering Yamaguchi University
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Kushibiki Jun-ichi
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Kushibiki Jun-ichi
Department Of Electrical Engineering Faculty Of Engineering Tohoku University
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Matsuura Kaori
Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University
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