In-Plane Distribution of Phase Transition Temperature of KTa1-xNbxO3 Measured with Single Temperature Sweep

概要

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We demonstrate that the paraelectric to ferroelectric phase transition temperature $T_{\text{C}}$ distribution of KTa1-xNbxO3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The $T_{\text{C}}$ measurement precision (standard deviation) is estimated to be 0.05 °C, where the standard deviation is defined as $[\sum_{i = 1}^{20}\sum_{j = 1}^{4}(T_{\text{C-\scale70%$i\aku j$}}-\bar{T}_{\text{C-\scale70%$i$}})^{2}/(4\times 20-1)]^{1/2}$, in which $T_{\text{C-\scale70%$i\aku j$}}$ is the $T_{\text{C}}$ value at point $i$ measured in the $j$th trial, and $\bar{T}_{\text{C-\scale70%$i$}}$ is the trial average of $T_{\text{C}}$ at point $i$.
Japan Society of Applied Physicsの論文
2008-10-25