Scanning Nonlinear Dielectric Microscopy with Contact Sensing Mechanism for Observation of Nanometer Sized Ferroelectric Domains
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概要
- 論文の詳細を見る
A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO_3 single crystal and in PbTiO_3 thin film were observed. By measuring the c-c domain wall of BaTiO_3, the microscope was confirmed to have nanometer-order resolution.
- 社団法人応用物理学会の論文
- 1999-09-30
著者
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CHO Yasuo
Research Institute of Electrical Communication, Tohoku University
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MATSUURA Kaori
Research Institute of Electrical Communication, Tohoku University
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KAZUTA satoshi
Research Institute of Electrical Communication, Tohoku University
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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Kazuta Satoshi
Research Institute Of Electrical Communication Tohoku University
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Matsuura K
Research Institute Of Electrical Communication Tohoku University
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