Fundamental Study on Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy
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概要
- 論文の詳細を見る
Scanning nonlinear dielectric microscopy (SNDM) is the first successful purely electrical method for observing the ferroelectric domain on the sub-nanometer order. As another high-resolution method for measuring ferroelectric domains, the piezoelectric response imaging method is often reported. In this study, it is confirmed that SNDM has a much higher resolution than piezoelectric imaging under the same experimental condition using the same system. First, the resolution of SNDM is described, and then, the resolution of SNDM is compared with that of piezoelectric imaging. Finally, a fundamental study for applying the SNDM system to a ferroelectric reading-recording system is performed, and it is concluded that SNDM has sufficient performance for application to the ferroelectric memory system.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-30
著者
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MATSUURA Kaori
Research Institute of Electrical Communication, Tohoku University
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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Odagawa Hiroyuki
Research Institute Of Electrical Communication Tohoko University
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Odagawa Hiroyuki
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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