Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy
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概要
- 論文の詳細を見る
The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-30
著者
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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Ohara Koya
Research and Development Center, Tsuchiya Co., Ltd., 22-4 Higashinamikikitayama-machi, Chiryu, Aichi 472-0006, Japan
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Ohara Koya
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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