Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy
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概要
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Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) has the ability to simultaneously acquire the surface topography and polarization distribution at the nanoscale through the measurement of local nonlinear dielectric constants of materials. NC-SNDM was here applied to the observation of Si(111) reconstructed surfaces. Images of the polarization distribution clearly distinguished disordered regions of the surface, often called $1\times 1$ regions, at the boundaries between the regular ($7\times 7$) domains. We acquired polarization images of surfaces with different sizes of $1\times 1$ regions and show that NC-SNDM has the potential to image trapped charges of surfaces and interfaces.
- 2011-09-25
著者
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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Yamasue Kohei
Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan
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