Matsuura K | Research Institute Of Electrical Communication Tohoku University
スポンサーリンク
概要
関連著者
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Matsuura K
Research Institute Of Electrical Communication Tohoku University
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CHO Yasuo
Research Institute of Electrical Communication, Tohoku University
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Cho Yasuo
Research Institute Of Electrical Communication Tohoku University
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小田川 裕之
東北大学電気通信研究所
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MATSUURA Kaori
Research Institute of Electrical Communication, Tohoku University
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ODAGAWA Hiroyuki
Research Institute of Electrical Communication, Tohoku University
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KAZUTA satoshi
Research Institute of Electrical Communication, Tohoku University
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Kazuta Satoshi
Research Institute Of Electrical Communication Tohoku University
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Odagawa Hiroyuki
Research Institute Of Electrical Communication Tohoko University
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山之内 和彦
東北大学電気通信研究所
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山之内 和彦
東北工業大学
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Yamaguchi Kunio
Electronics Technology Research Center Mitsubishi Materials Co. Ltd.
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山之内 和彦
東北大学研
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Iwasaki Jun
Optical Division Research And Development Department Nikon Corporation
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YAMANOUCHI Kazuhiko
Research Institute of Electrical Communication, Tohoku University
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MATSUURA Kaori
Department of Electrical Communication, Faculty of Engineering, Tohoku University
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Matsuura Kaori
Department Of Electrical And Electronics Engineering Faculty Of Engineering Yamaguchi University
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OOKI Hiroshi
Optical Division, Nikon Corporation
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Yamanouchi Kazuhiko
Research Institute Of Electrical Communication Tohoku University
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ARIMOTO Rieko
Optical Division, Research and Development Department, Nikon Corporation
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SHIONOYA Takashi
Central Research Laboratory, Nikon, Corporation
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MATSUURA Keiji
Central Research Laboratory, Nikon, Corporation
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IWASAKI Jun
Central Research Laboratory, Nikon, Corporation
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Ooki H
Nikon Corp. Tokyo Jpn
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Ooki Hiroshi
Optical Division Nikon Corporation
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Arimoto Rieko
Optical Division Research And Development Department Nikon Corporation
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Shionoya T
Nikon Corp. Tokyo Jpn
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Matsuura Kaori
Department of Electrical and Electronic Engineering, Faculty of Engineering, Yamaguchi University
著作論文
- Measurement of the Ferroelectric Domain Distributions Using Nonlinear Dielectric Response
- Observation of Ultrathin Single-Domain Layers Formed on LiTaO_3 and LiNbO_3 Surfaces Using Scanning Nonlinear Dielectric Microscope with Submicron Resolution
- Scanning Nonlinear Dielectric Microscopy with Contact Sensing Mechanism for Observation of Nanometer Sized Ferroelectric Domains
- Laser Scanning Mode Interference Contrast Microscope and Its Application to Step Height Measurement