Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
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概要
- 論文の詳細を見る
- 2001-03-15
著者
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Sugawara Yasuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Morita Seizo
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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SUEHIRA Nobuhito
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Suehira Nobuhito
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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