High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
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概要
- 論文の詳細を見る
We have developed high-speed phase-modulation atomic force microscopy (PM-AFM) in a constant-amplitude (CA) mode. Using this imaging mode, we have theoretically demonstrated that energy dissipation due to tip–sample interaction can be obtained from the excitation amplitude of a cantilever. Moreover, we have found that the photothermal excitation method is better than the acoustic excitation method for cantilever oscillation in liquids. For the first time, we have demonstrated that a homebuilt high-speed PM-AFM in the CA mode has the capability to simultaneously measure the topography and energy dissipation with a material-specific contrast for a PS/PIB polymer-blend film.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-07-25
著者
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Nomura Hikaru
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Naitoh Yoshitaka
Department Of Applied Chemistry Graduate School Of Engineering Osaka University
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Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Li Yan
Department Of Applied Chemistry Graduate School Of Engineering Kyushu University
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Li Yan
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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Kobayashi Naritaka
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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Kageshima Masami
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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