Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1990-08-20

著者

• SUGAWARA Yasuhiro

  Department of Applied Physics, Graduate School of Engineering, Osaka University

• Ida T

  Inst. Physical And Chemical Res. (riken) Saitama Jpn

• MORITA Seizo

  Department of Physics, Faculty of Science, Hiroshima University

• ISHIZAKA Tatsuya

  Research Institute of Electrical Communication, Tohoku University

• Ishizaka Tatsuya

  Research Institute Of Electrical Communication Tohoku University

• Morita Seizo

  Department Of Electronic Engineering Faculty Of Engineering Iwate University

• Sugawara Yasuhiro

  Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University

関連論文

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• Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
• Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
• Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
• Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
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• Optical Near-Field Imaging Using the Kelvin Probe Technique
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• Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
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• Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
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• Origin of Anomalous Corrugation Height of STM Images of Graphite
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• Scanning Tunneling Potentiometry/Spectroscopy (STP/STS)
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• Contact Electrification on Thin Silicon Oxide in Vacuum
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