Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1990-01-20
著者
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Imai S
Research Institute Of Electrical Communication Tohoku University
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Imai Syozo
Research Institute Of Electrical Communication Tohoku University
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Imai Syozo
Research Institute Electrical Communication Tohoku University
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
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ISHIZAKA Tatsuya
Research Institute of Electrical Communication, Tohoku University
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Imai S
Kyoto Univ. Kyoto Jpn
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Mikoshiba Nobuo
Research Institute Of Electorical Communication Tohoku University
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