Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction(Condensed matter: structure and mechanical and thermal properties)
スポンサーリンク
概要
- 論文の詳細を見る
We investigated NC-AFM imaging mechanism on a Si(111)7×7 surface under the strong interaction condition working between dangling bonds on the tip and the surface atoms. The surface adatom appeared in the image as a bright spot, which became larger with stronger interaction condition. Upon further strong interaction, we could detect the rest atoms in the unfaulted half unit of the 7×7 surface image as prominent sharp bright dots with 1 Å width. Besides, the dot appeared with the lateral shift by 2 Å as compared to the surface adatom image. We found the strong covalent interaction between the dangling bonds on the tip atom and the surface atoms influenced onto the image variation.
- 社団法人日本物理学会の論文
- 2007-03-15
著者
-
LI Yan
Department of Histology and Embryology, Zhongshan School of Medicine, Sun Yat-sen University
-
Li Yan
Department Of Dermatology Affiliated Union Hospital Tongji Medical College Huazhong University Of Sc
-
Nomura Hikaru
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
NAITOH Yoshitaka
Department of Applied Physics, Graduate School of Engineering, Osaka University
-
KAGESHIMA Masami
Department of Applied Physics, Graduate School of Engineering, Osaka University
-
SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
-
MOMOTANI Kohji
Department of Applied Physics, Graduate School of Engineering, Osaka University
-
Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Naitoh Yoshitaka
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Naitoh Yoshitaka
Department Of Applied Chemistry Graduate School Of Engineering Osaka University
-
Kageshima Masami
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Li Yan
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Momotani Kohji
Department Of Applied Physics Graduate School Of Engineering Osaka University
-
Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
-
Li Yan
Department Of Applied Chemistry Graduate School Of Engineering Kyushu University
関連論文
- NT-3 gene modified Schwann cells promote TrkC gene modified mesenchymal stem cells to differentiate into neuron-like cells in vitro
- Gradient decrement of annealing time can improve PCR with fluorescent-labeled primers(METHODS)
- Effect of Surface Stress around the S_A Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K
- Force Microscopy Imaging of Rest Atom on Si(111)7×7 Surface under Strong Tip-Surface Interaction(Condensed matter: structure and mechanical and thermal properties)
- Visceral hypersensitivity following cold water intake in subjects with irritable bowel syndrome
- A New Enzyme Immunoassay for Aconitine and Its Application to Quantitative Determination of Aconitine Levels in Plasma(Pharmacognosy)
- Protective effect of bicyclol on liver injury induced by hepatic warm ischemia/reperfusion in rats
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Association of Ala589Ser polymorphism of WNK4 gene with essential hypertension in a high-risk Chinese population
- Structure and Deposition Mechanism of 10-Undecenoic Acid Self-Assembled Layers on H-Si(111) Surfaces Studied by Atomic Force Microscopy and Fourier-Transform Infrared
- Cardiac Functional Analysis by Electrocardiography, Echocardiography and in situ Hemodynamics in Streptozotocin-Induced Diabetic Mice
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Electronic Structure of the Organic Superconductor k-(BEDT-TTF)_2Cu(NCS)_2 Studied by Angle-Resolved Photoemission Spectroscopy
- Pd-catalyzed Coupling Reaction of Allyl and Propargyl Ethers with Chlorosilanes
- Pd-Catalyzed Cross-Coupling Reaction of Alkyl Tosylates and Bromides with Grignard Reagents in the Presence of 1, 3-Butadiene
- Nature of Tip-Sample Interaction in Dynamic Mode Atomic Force Microscopy
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Nanorheology of Polymer Blends Investigated by Atomic Force Microscopy ( Scanning Tunneling Microscopy)
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Endothelin signaling axis activates osteopontin expression through PI3 kinase pathway in A375 melanoma cells
- Expression of GLUT-1 in psoriasis and the relationship between GLUT-1 upregulation induced by hypoxia and proliferation of keratinocyte growth
- Growth of a Two-Dimensional Nucleus on a Cleaved(010)Surface of (NH_2CH_2COOH)_3H_2SO_4
- Time Evolution of Surface Topography arournd a Domain Wall in Ferroelectric (NH_2CH_2COOH)_3・H_2SO_4
- Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- Observation of Atormic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- Generation of Debris in Water-Assisted Femtosecond Laser Drilling of Silica Glass
- Characterization of Micro-Channels Fabricated by In-Water Ablation of Femtosecond Laser Pulses
- Artifact and Fact of Si(111)7 X7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) : Surfaces, Interfaces, and Films
- In Situ Imaging of Electrochemical Deposition of Ag on Au(111)
- Atomic Resolution Imaging on Si(100)2 × 1 and Si(100)2 × 1 : H Surfaces with Noncontact Atomic Force Microscopy
- Cardioprotective Effect of Orally Administered Angiotensin-Converting Enzyme Inhibitor Against Ischemia : Reperfusion Injury in the Isolated Rat Heart
- Breast-feeding in Bangkok, Thailand: Current status, maternal knowledge, attitude and social support
- Prevalence and correlates of malnutrition among children in rural minority areas of China
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air
- Surface Plasmon Resonance Immunosensor for IgE Analysis Using Two Types of Anti-IgE Antibodies with Different Active Recognition Sites
- Nicorandil Pretreatment and Improved Myocardial Protection During Cold Blood Cardioplegia
- Off-Centric Concave Transducer for Acoustic Microscopy : Ultrasonic Microscopy and Nondestructive Testing
- Quantitative determination of apigenin and its metabolism in rat plasma after intravenous bolus administration by HPLC coupled with tandem mass spectrometry
- Jet ejection from droplets near the Leidenfrost temperature
- An experimental investigation of flow-induced acoustic resonance and flow field in a closed side branch system using a high time-resolved PIV technique
- NAND/NOR Logical Operation of a Magnetic Logic Gate with Canted Clock-Field
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Generation of Debris in Water-Assisted Femtosecond Laser Drilling of Silica Glass
- Characterization of Micro-Channels Fabricated by In-Water Ablation of Femtosecond Laser Pulses
- Heat Capacity of Pd-Si, Ni-Si-B and Zr-Based Metallic Glasses
- Active Contour Model Based on Salient Boundary Point Image for Object Contour Detection in Natural Image
- Gravity changes observed between 2004 and 2009 near the Tokai slow-slip area and prospects for detecting fluid flow during future slow-slip events
- Allergen-driven limiting dilution analysis of human IL-4 and IFN-γ production in allergic rhinitis and clinically tolerant individuals
- Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]
- Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer
- A Chinese homozygote of familial hypercholesterolemia: identification of a novel C263R mutation in the LDL receptor gene
- A Sensitive Label-free Amperometric CEA Immunosensor Based on Graphene-Nafion Nanocomposite Film as an Enhanced Sensing Platform
- The Expression of SOX9 and Type II Collagen in Condylar Cartilage of Adult Rat after Increasing OVD
- A sensitive LC-MS/MS method for determination of levamisole in human plasma : Application to pharmacokinetic study
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction
- Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy
- Expression and Characterisation of the Heavy Chain of Tetanus Toxin : Reconstiution of the Fully-Recombinant Dichain Protein in Active Form
- Force Mapping of the NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K
- Lx2-32c, a Novel Taxane Derivative, Exerts Anti-resistance Activity by Initiating Intrinsic Apoptosis Pathway in Vitro and Inhibits the Growth of Resistant Tumor in Vivo
- High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy
- Structure and Deposition Mechanism of 10-Undecenoic Acid Self-Assembled Layers on H-Si (111) Surfaces Studied by Atomic Force Microscopy and Fourier-Transform Infrared
- High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation
- Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K
- The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping