Ida T | Inst. Physical And Chemical Res. (riken) Saitama Jpn
スポンサーリンク
概要
関連著者
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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ISHIZAKA Tatsuya
Research Institute of Electrical Communication, Tohoku University
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Nakano A
Hitachi Chemical Co. Ltd. Ibaraki Jpn
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Nakano A
Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)
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Imai S
Research Institute Of Electrical Communication Tohoku University
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Imai Syozo
Research Institute Of Electrical Communication Tohoku University
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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Nakano Akihiko
Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)
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Imai Syozo
Research Institute Electrical Communication Tohoku University
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
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NAKANO Akihiko
VLSI Development Laboratories, IC Group, Sharp Corporation
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Imai S
Kyoto Univ. Kyoto Jpn
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Mikoshiba Nobuo
Research Institute Of Electorical Communication Tohoku University
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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FUKANO Yoshinobu
Department of Physics, Faculty of Science, Hiroshima University
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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IDA Tohru
VLSI Development Laboratories, IC Group, Sharp Corporation
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Nakano Akihiko
Vlsi Development Laboratories Ic Group Sharp Corporation
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Fukano Y
Department Of Physics Faculty Of Science Hiroshima University
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Okada Takao
Research Institute of Biomolecule Metrology Co., Ltd
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NAKANO Akihiko
Analysis Center, (IC) Group, Sharp Corpotation
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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OKADA Takao
Olympus Optical Co., Ltd.
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MISHIMA Syuzo
Olympus Optical Co., Ltd.
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ANDOH Yasuko
NTT Integrated Information & Energy Systems Laboratories
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KANEKO Reizo
Department of Opto-Mechatronics, Faculty of Systems Engineering, Wakayama University
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Okada Takao
Research Institute Of Biomolecule Metrology Co. Ltd
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IDA Toru
VLSI Development Laboratories, IC Group, Sharp Corporation
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IDA Tohru
Analysis Center, VLSI Development Laboratories, IC Group, Sharp Corporation
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KUMAGAI Kozo
Department of Electronic Engineering, Faculty of Engineering, Iwate University
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Ida Tohru
Vlsi Development Laboratories Ic Group Sharp Corporation
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Kumagai K
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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Nakano Akihiko
Analysis Center (ic) Group Sharp Corpotation
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Okada Takao
Research Department R&d Division Taki Chemical Co. Ltd.
著作論文
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air
- Potentiometry Combined with Atomic Force Microscope
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)
- Origin of Anomalous Corrugation Height of STM Images of Graphite
- Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air