FUKANO Yoshinobu | Department of Physics, Faculty of Science, Hiroshima University
スポンサーリンク
概要
関連著者
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FUKANO Yoshinobu
Department of Physics, Faculty of Science, Hiroshima University
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Fukano Y
Department Of Physics Faculty Of Science Hiroshima University
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Sugawara Yasuhiro
Deparment Of Electrical Engineering Faculty Of Engineering Tohoku University
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Morita Seizo
Department Of Electronic Engineering Faculty Of Engineering Iwate University
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SUGAWARA Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University
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Sugawara Yasuhiro
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Okada T
Joint Research Center For Atom Technology (jrcat)
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Uchihashi Takayuki
Department of Physics, Kanazawa University
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MORITA Seizo
Department of Physics, Faculty of Science, Hiroshima University
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Ohta Takayuki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
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Uchihashi Takayuki
Department Of Mathematics And Physics Grad School Of Natural Science And Technology Kanazawa Univ.
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Uchihashi Takayuki
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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OKUSAKO Takahiro
Department of Physics, Faculty of Science, Hiroshima University
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YAMANISHI Yoshiki
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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OASA Takahiko
Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd.
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Yamanishi Yoshiki
Advanced Technology Research Laboratories Sumitomo Metal Industries Ltd.
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CHAYAHARA Akiyoshi
Laboratory of Purified Materials, National Institute of Advanced Industrial Science and Technology
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CHAYAHARA Ayumi
Department of Physics, Faculty of Science, Hiroshima University
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Chayahara Akiyoshi
Department Of Electrical Engineering Hiroshima University
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Chayahara Akiyoshi
Government Industrial Research Institute Osaka
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CHAYAHARA Akiyoshi
AIST Kansai
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Sugawara Y
Department Of Applied Physics Graduate School Of Engineering Osaka University
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Ida T
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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Nakano A
Hitachi Chemical Co. Ltd. Ibaraki Jpn
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Nakano Akihiko
Molecular Membrane Biology Laboratory Riken(the Institute Of Physical And Chemical Research)
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Nakano A
Molecular Membrane Biology Laboratory Riken (the Institute Of Physical And Chemical Research)
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Ishizaka Tatsuya
Research Institute Of Electrical Communication Tohoku University
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Yamada Junji
Department of Pharmacotherapeutics, School of Pharmacy, Tokyo University of Pharmacy and Life Scienc
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Okada Takao
Research Institute of Biomolecule Metrology Co., Ltd
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Yamada Junji
Department Of Physics Faculty Of Science Hiroshima University
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NAKANO Akihiko
Analysis Center, (IC) Group, Sharp Corpotation
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IGARASHI Masaru
NTT Interdisciplinary Research Laboratories
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KANEKO Reizo
NTT Interdisciplinary Research Laboratories
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Yamada Junji
Department Of Clinical Biochemistry School Of Pharmacy Tokyo University Of Pharmacy And Life Science
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NAKANO Akihiko
VLSI Development Laboratories, IC Group, Sharp Corporation
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IDA Tohru
VLSI Development Laboratories, IC Group, Sharp Corporation
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MORITA Seizo
Laboratories of Crystal Physics, Faculty of Science, Hiroshima University
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Nakano Akihiko
Vlsi Development Laboratories Ic Group Sharp Corporation
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Okada Takao
Research Institute Of Biomolecule Metrology Co. Ltd
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Kaneko Reizo
Ntt Interdisciplinary Laboratories Kaneko Laboratory
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HONTANI Koji
Department of Physics, Faculty of Science, Hiroshima University
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IDA Tohru
Analysis Center, VLSI Development Laboratories, IC Group, Sharp Corporation
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Igarashi M
Joint Research Center For Atom Technology(jrcat) Angstrom Technology Partnership
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Ida Tohru
Vlsi Development Laboratories Ic Group Sharp Corporation
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Kaneko R
Wakayama Univ. Wakayamashi Jpn
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Hontani Koji
Department Of Physics Faculty Of Science Hiroshima University
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Nakano Akihiko
Analysis Center (ic) Group Sharp Corpotation
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Okada Takao
Research Department R&d Division Taki Chemical Co. Ltd.
著作論文
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force / Tunneling Microscope (AFM/STM) in Air
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]
- Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer