Effect of the Shunt Capacitance on the ac Josephson Effect in Nb Point Contacts
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概要
- 論文の詳細を見る
The ac Josephson effects in Nb point contacts were measured using optically pumped sub-millimeter-wave laser. Laser-induced constant voltage steps (Shapiro steps) were observed on the dc I-V curves of the hysteretic junction as well as non-hysteretic junctions. We found that the height of the fundamental step normalized to the critical current at no irradiation in hysteretic junctions was considerably larger than that previously reported. The enhancement of the step observed can be explained by taking the effect of the shunt capacitance into consideration.
- 社団法人応用物理学会の論文
- 1980-08-05
著者
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NOGUCHI Takashi
Research and Development Dept., Semiconductor Group, SONY
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Mikoshiba N
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L
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Mikoshiba Nobuo
Research Institute Of Electrical Communication Tohoku University
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Morita Seizo
Research Institute Of Electrical Communication Tohoku University
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OHSAWA Keishi
Research Institute of Electrical Communication, Tohoku University
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Noguchi Takashi
Research Institute Of Electrical Communication Tohoku University
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Ohsawa Keishi
Research Institute Of Electrical Communication Tohoku University
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Mikoshiba Nobuo
Research Institute Of Electorical Communication Tohoku University
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Noguchi Takashi
Research And Development Dept. Semiconductor Group Sony
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