Carbon Nanotube Tip for Scanning Tunneling Microscope
スポンサーリンク
概要
- 論文の詳細を見る
We attached multiwall carbon nanotubes (CNTs) to the top of a Au tip using a manipulation system, and used the tip as a probe for a scanning tunneling microscope (STM). We measured Au(111) surfaces using an ultrahigh-vacuum-STM with an electrochemically etched Au tip and a multiwall CNT tip attached to the top of the Au tip. When the CNT tip was cleaned by heating in a coil filament, we observed the $22\times\sqrt{3}$ reconstruction of clean Au(111). With an uncleaned CNT tip, many adsorbates were observed along the reconstruction, which may be contaminants desorbed from the CNT tip. The stability of the CNT tip depends on its length, diameter and the contact to the base material. Thus far, we have obtained good resolution using a CNT with a length of less than 200 nm. We found that when the CNT was not vertical to the sample surfaces, the tip-surface interaction increased the stability of the CNT tip.
- 2001-06-30
著者
-
Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)
-
Uchihashi Takayuki
Jrcat-angstrom Technology Partnership (atp)
-
Choi Nami
JRCAT–Angstrom Technology Partnership (ATP), Higashi 1-1-4, Tsukuba, Ibaraki 305-0046, Japan
-
Mizutani Wataru
Joint Research Center for Atom Technology (JRCAT)–National Institute of Advanced Industrial Science and Technology, AIST Tsukuba Central 4, Higashi 1-1-1, Tsukuba, Ibaraki 305-8562, Japan
-
Uchihashi Takayuki
JRCAT–Angstrom Technology Partnership (ATP), Higashi 1-1-4, Tsukuba, Ibaraki 305-0046, Japan
関連論文
- 小型走査電子顕微鏡用カーボンナノチューブ電子銃の安定性評価
- 走査プローブ顕微鏡による表面原子・分子化学分析
- 原子操作と識別技術
- 探針に吸着させた原子種の同定
- 25p-YM-3 原子操作によりSiを捕獲したSTM探針のFIM観察
- 6p-B-12 原子操作によるタングステンシリサイド形成
- 半導体デバイス解析用局所プラズマ加工装置の開発
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Anomaly of X-ray Diffraction Profile in Single-Walled Carbon Nanotubes
- Initial Stage of Nitridation of GaAs(001): Atomic Scale View
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Measurement of Intramolecular Energy Dissipation and Stiffness of a Single Peptide Molecule by Magnetically Modulated Atomic Force Microscopy
- Investigation of the Peptide Conformation by Measuring Force Curve using AFM
- Measurement of the Length of the α Helical Section of a Peptide Directly Using Atomic Force Microscopy
- C_ Molecular Stumbling inside Single-Walled Carbon Nanotubes
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope
- Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air
- Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air
- Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide
- Potentiometry Combined with Atomic Force Microscope
- Charge Storage on Thin SrTiO_3 Film by Contact Electrification ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Resonant Magnetotunneling in AlGaAs/GaAs Triple Barrier Diodes : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Two Dimensional Electrons and Ions
- Measurement of Local Density of States by Scanning Tunneling Spectroscopy at Low Temperature : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Charge Density Waves
- Effect of Atomic Force on the Surface Corrugation of 2H-NbSe_2 Observed by Scanning Tunneling Microscopy
- Effect of Amines on Single-Walled Carbon Nanotubes in Organic Solvents : Control of Bundle Structures
- Carbon Nanotube Tip for Scanning Tunneling Microscope
- Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
- Surface Observation and Modification of Si Substrate in NH_4F and H_2SO_4 Solutions
- Surface Observation and Modification of Si Substrate in Solutions
- Electrochemical Scanning Tunneling Microscopy and Atomic Force Microscopy Observationson Si(111) in Several Solutions
- Atomic Structure of Hydrogen-Terminated Si(111) Surfaces by Hydrofluoric Acid Treatments
- Heat-Induced Phase Separation of Self-Assembled Monolayers of a Fluorocarbon-Hydrocarbon Asymmetric Disulfide on a Au(111) Surface ( Scanning Tunneling Microscopy)
- Lateral Conduction Model for Intermolecular Interaction of Self-Assembled Monolayers
- Identification of Materials using Direct Force Modulation Technique with Magnetic AFM Cantilever ( Scanning Tunneling Microscopy)
- Nanometer Modifications of Non-Conductive Materials Using Resist-Films by Atomic Force Microscopy
- Monolayer Nitridation of Si(001) Surfaces
- Monolayer Nitridation of Si(001) Surfaces
- Preparatiorn of Self-Assembled Mercaptoalkanoic Acid Multilayers on GaAs (110) Surfaces
- Nanometer-Scale Wires of Monolayer Height Alkanethiols on AlGaAs/GaAs Heterostructures by Selective Chemisorption
- Step Formation on Au (111) Observed by Scanning Tunneling Microscope
- AFM Observation of Self-Assembled Monolayer Films on GaAs (110)
- Local Properties of Phase-Separated Polymer Surfaces by Force Microscopy
- Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification
- Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope
- Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide
- Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate
- Piezoelectric Actuator for Scanning Tunneling Microscopy : A: Applications and Fundamentals
- Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface
- Contact Electrification on Thin Silicon Oxide in Vacuum
- Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- Reproducible and Controllable Contact Electrification on a Thin Insulator
- 3F0930 Unidirectional alignment of stretched DNA molecules on an atomically flat surface
- Cross-sectional Scanning Tunneling Microscopy and Spectroscopy of Compound Semiconductor Heterostructures
- Nanoscale Indentation on Si(111) Surfaces with Scanning Tunneling Microscope ( Scanning Tunneling Microscopy)
- Cross-Sectiomal Scanning Tunneling Microscopy on Cleaved Si(111):Observation of Novel Reconstruction and Structural and Electrical Properties of MOS Interface
- Carbon Nanotube Tip for Scanning Tunneling Microscope
- Phase Transition of Silicon-Nitride Monolayer on Si(111) Surface Observed by Scanning Tunneling Microscopy
- Single Silicon Atom Detection on a Tungsten Tip
- Patterning and Functionalizing Self-Assembled Monolayers
- Theoretical Prediction and Atomic Force Microscope Observations of the Protein Nanotube Consisting of Homo-l-Amino Acid Penta-Peptide Nanorings