Phase Transition of Silicon-Nitride Monolayer on Si(111) Surface Observed by Scanning Tunneling Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-01
著者
-
Morita Yukinori
Joint Research Center For Atom Technology (jrcat)-national Institute For Advanced Interdisciplinary
-
Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)
-
Tokumoto Hiroshi
Joint Research Center For Atom Technology (jrcat)-national Institute For Advanced Interdisciplinary
関連論文
- 小型走査電子顕微鏡用カーボンナノチューブ電子銃の安定性評価
- 走査プローブ顕微鏡による表面原子・分子化学分析
- 原子操作と識別技術
- 探針に吸着させた原子種の同定
- 25p-YM-3 原子操作によりSiを捕獲したSTM探針のFIM観察
- 6p-B-12 原子操作によるタングステンシリサイド形成
- 半導体デバイス解析用局所プラズマ加工装置の開発
- Anomaly of X-ray Diffraction Profile in Single-Walled Carbon Nanotubes
- Initial Stage of Nitridation of GaAs(001): Atomic Scale View
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Measurement of Intramolecular Energy Dissipation and Stiffness of a Single Peptide Molecule by Magnetically Modulated Atomic Force Microscopy
- Investigation of the Peptide Conformation by Measuring Force Curve using AFM
- Measurement of the Length of the α Helical Section of a Peptide Directly Using Atomic Force Microscopy
- C_ Molecular Stumbling inside Single-Walled Carbon Nanotubes
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Resonant Magnetotunneling in AlGaAs/GaAs Triple Barrier Diodes : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Two Dimensional Electrons and Ions
- Measurement of Local Density of States by Scanning Tunneling Spectroscopy at Low Temperature : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Charge Density Waves
- Effect of Atomic Force on the Surface Corrugation of 2H-NbSe_2 Observed by Scanning Tunneling Microscopy
- Effect of Amines on Single-Walled Carbon Nanotubes in Organic Solvents : Control of Bundle Structures
- Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
- Surface Observation and Modification of Si Substrate in NH_4F and H_2SO_4 Solutions
- Surface Observation and Modification of Si Substrate in Solutions
- Electrochemical Scanning Tunneling Microscopy and Atomic Force Microscopy Observationson Si(111) in Several Solutions
- Atomic Structure of Hydrogen-Terminated Si(111) Surfaces by Hydrofluoric Acid Treatments
- Heat-Induced Phase Separation of Self-Assembled Monolayers of a Fluorocarbon-Hydrocarbon Asymmetric Disulfide on a Au(111) Surface ( Scanning Tunneling Microscopy)
- Lateral Conduction Model for Intermolecular Interaction of Self-Assembled Monolayers
- Identification of Materials using Direct Force Modulation Technique with Magnetic AFM Cantilever ( Scanning Tunneling Microscopy)
- Nanometer Modifications of Non-Conductive Materials Using Resist-Films by Atomic Force Microscopy
- Monolayer Nitridation of Si(001) Surfaces
- Monolayer Nitridation of Si(001) Surfaces
- Preparatiorn of Self-Assembled Mercaptoalkanoic Acid Multilayers on GaAs (110) Surfaces
- Nanometer-Scale Wires of Monolayer Height Alkanethiols on AlGaAs/GaAs Heterostructures by Selective Chemisorption
- Step Formation on Au (111) Observed by Scanning Tunneling Microscope
- AFM Observation of Self-Assembled Monolayer Films on GaAs (110)
- Local Properties of Phase-Separated Polymer Surfaces by Force Microscopy
- Piezoelectric Actuator for Scanning Tunneling Microscopy : A: Applications and Fundamentals
- Cross-sectional Scanning Tunneling Microscopy and Spectroscopy of Compound Semiconductor Heterostructures
- Nanoscale Indentation on Si(111) Surfaces with Scanning Tunneling Microscope ( Scanning Tunneling Microscopy)
- Cross-Sectiomal Scanning Tunneling Microscopy on Cleaved Si(111):Observation of Novel Reconstruction and Structural and Electrical Properties of MOS Interface
- Carbon Nanotube Tip for Scanning Tunneling Microscope
- Phase Transition of Silicon-Nitride Monolayer on Si(111) Surface Observed by Scanning Tunneling Microscopy
- Single Silicon Atom Detection on a Tungsten Tip