Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems(<特集>Special Section on Analog Circuit Techniques and Related Topics)

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概要

• 論文の詳細を見る

• This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.

• 2002-02-01

著者

• KOBAYASHI Haruo

  Department of Electronic Engineering, Graduate School of Engineering, Gunma University

• TAKAHASHI Yasuo

  Graduate School of Information Science and Technology, Hokkaido University

• Takahashi Y

  Hokkaido Univ. Sapporo‐shi Jpn

• Takahashi Y

  Ntt Basic Research Laboratories Ntt Cornoration

• Takahashi Y

  Osaka University

• Takahashi Yasuo

  Graduate School Of Information Science And Technology Hokkaido Univ.

• Takahashi Y

  Graduate School Of Information Science And Technology Hokkaido Univ.

• Kobayashi Haruo

  Department Of Electronic Engineering Faculty Of Engineering Gunma University

• Kobayashi Haruo

  Electronic Engineering Department Graduate School Of Engineering Gunma University

• Kobayashi Haruo

  The Department Of Electronic Engineering Faculty Of Engineering Gunma University

• Kobayashi Haruo

  Sanyo Lsi Design-system Soft Co. Ltd.

• Kobayashi K

  Kyoto Univ. Kyoto‐shi Jpn

• KOGURE Hideyuki

  Department of Electronic Engineering, Faculty of Engineering, Gunma University

• Onaya Yoshitaka

  Sanyo Lsi Design-system Soft Co. Ltd.

• Kogure H

  Department Of Electronic Engineering Faculty Of Engineering Gunma University

• Kobayashi H

  The Department Of Electronic Engineering Faculty Of Engineering Gunma University

• KOBAYASHI Kensuke

  LeCroy Corp.

• ONAYA Yoshitaka

  Department of Electronic Engineering, Faculty of Engineering, Gunma University

• TAKAHASHI Yuuich

  Department of Electronic Engineering, Faculty of Engineering, Gunma University

• ENOMOTO Kouhei

  Teratec Corp., Tokyo

• Enomoto Kouhei

  Teratec Corp. Tokyo

• Takahashi Yasuo

  The Tokyo Metropolitan Research Laboratory Of Public Health:graduate School Of Nutritional And Envir

• Kogure Hideyuki

  Department Of Electronic Engineering Faculty Of Engineering Gunma University

• Takahashi Yasuo

  Faculty Of Pharmaceutical Sciences Tokyo University Of Science

• KOBAYASHI HARUO

  Department of Animal Breeding, Faculty of Agriculture, University of Tokyo

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