Analysis of CMOS ADC Nonlinear Input Capacitance
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概要
- 論文の詳細を見る
This paper describes the nonlinear behavior of CMOS ADC input capacitance. Our SPICE simulation, based on the BSIM3v3 model, shows that the input capacitance of a typical CMOS flash-type ADO (with a single-ended NMOS differential pair preamplifier as the input stage) decreases as its input voltage increases; this is the opposite of what we would expect if we considered only MOSFET gate capacitance nonlinearity. We have found that this can be explained by the nonlinearity of the total effective input capacitance of each differential amplifier stage, taking into account not only MOSFET capacitance but also the fact that the contributions of the gate-source and gatedrain capacitances to the input capacitance of the differential pair change according to its input voltages (an ADO input voltage and a reference voltage). We also discuss design methods to reduce the value of the CMOS ADC effective input capacitance.
- 社団法人電子情報通信学会の論文
- 2002-05-01
著者
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KOBAYASHI Haruo
Department of Electronic Engineering, Graduate School of Engineering, Gunma University
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SATO Hiroyuki
Department of Hematology/Oncology, The Institute of Medical Science, The University of Tokyo
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TAKAHASHI Yasuo
Graduate School of Information Science and Technology, Hokkaido University
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Takahashi Y
Hokkaido Univ. Sapporo‐shi Jpn
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Takahashi Y
Ntt Basic Research Laboratories Ntt Cornoration
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Takahashi Y
Osaka University
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Kimura Yuichi
Dept. Of Electrical And Electronic Systems Saitama University
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TAKAHASHI Yuuichi
Department of Physics,Faculty of Science,Tokyo Metropolitan University
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Takahashi Yasuo
Graduate School Of Information Science And Technology Hokkaido Univ.
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Takahashi Y
Graduate School Of Information Science And Technology Hokkaido Univ.
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Kobayashi Haruo
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Kobayashi Haruo
Electronic Engineering Department Graduate School Of Engineering Gunma University
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Kobayashi Haruo
The Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Kobayashi Haruo
Sanyo Lsi Design-system Soft Co. Ltd.
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Myono Takao
Semiconductor Company Sanyo Electric Co. Ltd.
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KOGURE Hideyuki
Department of Electronic Engineering, Faculty of Engineering, Gunma University
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KIMURA Yasuyuki
Semiconductor Company, Sanyo Electric Co., Ltd
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ONAYA Yoshitaka
Sanyo LSI Design System Soft Co. Ltd
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TANAKA Kouji
Semiconductor Company, Sanyo Electric Co., Ltd
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Onaya Yoshitaka
Sanyo Lsi Design-system Soft Co. Ltd.
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Kogure H
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Kobayashi H
The Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Takahashi Yasuo
The Tokyo Metropolitan Research Laboratory Of Public Health:graduate School Of Nutritional And Envir
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Kimura Y
Department Of Electrical And Electronic Systems Saitama University
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Kogure Hideyuki
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Takahashi Yuuichi
Department Of Physics Faculty Of Science Tokyo Metropolitan University
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Takahashi Yasuo
Faculty Of Pharmaceutical Sciences Tokyo University Of Science
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Tanaka Kouji
Semiconductor Company Sanyo Electric Co. Ltd
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Sato H
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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Sato Hiroyuki
Department Of Biomolecular Science Fac.sci. Toho Univ.
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Myono Takao
Semiconductor Company Sanyo Electric Co. Ltd
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KOBAYASHI HARUO
Department of Animal Breeding, Faculty of Agriculture, University of Tokyo
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Sato Hiroyuki
Department of Applied Physics, Graduate School of Engineering, Tohoku University
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