Verification of Stable Circuit Operation of 180nm Current Controlled MOS Current Mode Logic under Threshold Voltage Fluctuation

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概要

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• We have succeeded in fabricating 180nm Current Controlled MOS Current Mode Logic (CC-MCML) and verified the stable circuit operation of 180nm CC-MCML under threshold voltage fluctuations by measurement. The performance stability of the CC-MCML inverter under the fluctuations of threshold voltage of NMOS and PMOS is evaluated from the viewpoint of diminishing the bias offset voltage ΔVB. The ΔVB, that is defined as (base voltage of output waveform) - (base voltage of input waveform), is a key design parameter for differential circuit. It is shown that when the threshold voltage of NMOS fluctuates in the range of 0.53V to 0.69V, and threshold voltage of PMOS fluctuates in the range of -0.47V to -0.67V, the CC-MCML technique is able to suppress ΔVB within only 30mV, where as the conventional MCML technique caused maximum ΔVB of 1.0V. In this paper, it is verified for the first time that the fabricated CC-MCML is more tolerant against the fluctuations of threshold voltages than the conventional MCML.

• 2011-05-01

著者

• ENDOH Tetsuo

  Center for Interdisciplinary Research, Tohoku University

• Imamoto Takuya

  Center For Interdisciplinary Research Tohoku University

• Endoh Tetsuo

  Center For Interdisciplinary Research Tohoku University

• Endoh Testuo

  Center For Interdisciplinary Research Tohoku University

• Sasaki Takeshi

  Center For Interdisciplinary Research Tohoku University

• Koyanagi Mitsumasa

  Cir Tohoku University

• Endoh Tetsuo

  Tohoku Univ. Sendai‐shi Jpn

• Na Hyoungjun

  Center For Interdisciplinary Research Tohoku University

• Kamiyanagi Masashi

  Center For Interdisciplinary Research Tohoku University

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