Saluja Kewal | Univ. Wisconsin‐madison Usa

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• 同名の論文著者
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関連著者

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• WEN Xiaoqing

  Kyushu Institute of Technology

• Xiaoqing Wen

  Department Of Information Engineering Mining College Akita University

• Wen Xiaoqing

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Kinoshita Kozo

  Faculty Of Informatics Osaka Gakuin University

• Takamatsu Y

  Graduate School Of Science And Engineering Ehime University

• Takahasi Hiroshi

  The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku

• Saluja Kewal

  ウィスコンシン大学マディソン校

• Saluja Kewal

  ウイスコンシン大学

• Takahashi H

  Graduate School Of Science And Engineering Ehime University

• サルージャ ケーワルk.

  Department Of Electrical And Computer Engineering University Of Wisconsin - Madison

• Saluja Kewal

  ウィスコンシン大学

• Saluja Kewal

  Univ. Of Wisconsin-madison Dept. Of Electrical And Computer Engineering

• Kajihara Seiji

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Higami Y

  Graduate School Of Science And Engineering Ehime University

• 樹下 行三

  大阪学院大 情報

• 樋上 喜信

  愛媛大学大学院

• WEN Xiaoqing

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• 梶原 誠司

  九州工業大学:jst Crest

• Kinoshita Kozo

  Faculty Of Engineering Osaka University

• Kajihara S

  Kyushu Inst. Technol. Iizuka‐shi Jpn

• Kajihara Seiji

  Faculty Of Engineering Osaka University

• Takahashi Hiroshi

  Graduate School of Environmental Studies, Tohoku University

• 高松 雄三

  愛媛大学理工学研究科電子情報工学専攻

• 高松 雄三

  愛媛大学

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• KOBAYASHI Shin-ya

  Graduate School of Science and Engineering, Ehime University

• TAKAMATSU Yuzo

  Graduate School of Science and Engineering, Ehime University

• YAMATO Yuta

  Kyushu Institute of Technology

• WANG Laung-Terng

  SynTest

• 樋上 喜信

  愛媛大学 工学部

• Tamamoto H

  The Department Of Information Engineering Akita University

• 樹下 行三

  大阪大学 大学院工学研究科

• Takahashi Hiroshi

  Department Of Cardiology Nihon University Surugadai Hospital

• 梶原 誠司

  九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化システムセンター

• 梶原 誠司

  九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化総合技術センタ

• Kobayashi S

  Graduate School Of Science And Engineering Ehime University

• Miyase K

  Kyushu Institute Of Technology

• Takamatsu Yuzo

  Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science

• Yamashita Yoshiyuki

  Densotechno Co.

• Miyase Kohei

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• Kadoyama Shuhei

  Graduate School Of Science And Engineering Ehime University

• Takahashi Hiroshi

  Department Of Applied Aquabiology National Fisheries University

• Takahashi Hiroshi

  Graduate School Of Environmental Studies Tohoku University

• 樋上 喜信

  愛媛大学

• Takamatsu Yuzo

  Department of Computer Science, Ehime University

• Tamamoto Hideo

  The Department Of Information Engineering Akita University

• 樹下 行三

  大阪大学大学院工学研究科応用物理専攻

• Xiaoqing WEN

  the Department of Information Engineering, Akita University

• SALUJA Kewal

  the Department of Electrical and Computer Engineering, University of Wisconsin

• KINOSHITA Kozo

  the Department of Applied Physics, Osaka University

• Xiaoqing Wen

  The Department Of Information Engineering Akita University

• Saluja Kewal

  The Department Of Electrical And Computer Engineering University Of Wisconsin

• 玉本 英夫

  秋田大学工学資源学部情報工学科

• 樋上 喜信

  愛媛大学工学部情報工学科

• 高松 雄三

  愛媛大学工学部情報工学科

• 梶原 誠司

  九州工業大学情報工学部電子情報工学科

• MIYASE Kohei

  Kyushu Institute of Technology

• FURUKAWA Hiroshi

  Kyushu Institute of Technology

• KAJIHARA Seiji

  Kyushu Institute of Technology

• Kawano K

  Okayama Univ. Okayama‐shi Jpn

• SALUJA Kewal

  University of Wisconsin-Madison

• 玉本 英夫

  秋田大学鉱山学部情報工学科

• 温 暁青

  シンテスト・テクノロジース

• 温 暁青

  秋田大学鉱山学部情報工学科

• Hatayama Kazumi

  Starc

• 高松 雄三

  愛媛大学工学部

• Kawano K

  Information Technology Center Okayama University

• Saluja K

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Kinoshita K

  Department Of Information Networking Graduate School Of Information Science And Technology Osaka Uni

• Kajihara Seiji

  Kyushu Insteitute Of Technology

• HIGAMI Yoshinobu

  Department of Computer Science, Ehime University

• TAKASHIMA Atsushi

  Kyushu Institute of Technology

• NODA Kenji

  STARC

• ITO Hideaki

  STARC

• AIKYO Takashi

  STARC

• MIYASE Kohei

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• YAMATO Yuta

  Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

• SUZUKI Tatsuya

  Faculty of Information Sciences, Hiroshima City University

• Yamato Yuta

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology

• MIYASE Kohei

  Innovation Plaza Fukuoka, Japan Science and Technology Agency

• BAIK Dong

  Univ. of Wisconsin-Madison, Dept. of Electrical and Computer Engineering

• TAMAMOTO Hideo

  Department of Information Engineering, Akita University

• Baik Dong

  Univ. Of Wisconsin-madison Dept. Of Electrical And Computer Engineering

• PHADOONGSIDHI Marong

  Department of Electrical and Computer Engineering, University of Wisconsis

• Phadoongsidhi Marong

  Department Of Electrical And Computer Engineering University Of Wisconsis

• Suzuki Tatsuya

  Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology:(present Office)d

• Kajihara Seiji

  Kyushu Inst. Technol. Iizuka‐shi Jpn

• 梶原 誠司

  九州工業大学

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著作論文

• トランジスタ短絡故障モデルにおける等価故障解析について
• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
• Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
• A Study of Capture-Safe Test Generation Flow for At-Speed Testing
• A Novel ATPG Method for Capture Power Reduction during Scan Testing(Dependable Computing)
• A Per-Test Fault Diagnosis Method Based on the X-Fault Model(Dependable Computing)
• A New Method for Low-Capture-Power Test Generation for Scan Testing(Dependable Computing)
• On Design for I_-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies(Computer Components)
• An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
• An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
• Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
• Testing Core-Based System-on-a-Chip Designs
• Compaction of Test Vectors for IDDQ Testing of Sequential Circuits
• Transistor Leakage Fault Diagnosis for CMOS Circuits(Special Issue on Test and Diagnosis of VLSI)
• Transistor Leakage Fault Diagnosis with I_DDQ and Logic Information
• 順序回路のブリッジ故障に対するIDDQテストのための静的なテスト系列圧縮法 (テストと設計検証論文特集)
• 順序回路に対するIDDQテスト時間短縮について
• 順序回路に対するIDDQテスト時間短縮について
• 順序回路に対するIDDQテスト時間短縮について
• ランダムアクセススキャン : テスト時消費電力,テストデータ量,テスト時開削減法(VLSI設計とテスト)

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