Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools

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概要

• 論文の詳細を見る

• This paper presents methods for detecting transistor short faults using logic level fault simulation and test generation. The paper considers two types of transistor level faults, namely strong shorts and weak shorts, which were introduced in our previous research. These faults are defined based on the values of outputs of faulty gates. The proposed fault simulation and test generation are performed using gate-level tools designed to deal with stuck-at faults, and no transistor-level tools are required. In the test generation process, a circuit is modified by inserting inverters, and a stuck-at test generator is used. The modification of a circuit does not mean a design-for-testability technique, as the modified circuit is used only during the test generation process. Further, generated test patterns are compacted by fault simulation. Also, since the weak short model involves uncertainty in its behavior, we define fault coverage and fault efficiency in three different way, namely, optimistic, pessimistic and probabilistic and assess them. Finally, experimental results for ISCAS benchmark circuits are used to demonstrate the effectiveness of the proposed methods.

• （社）電子情報通信学会の論文
• 2008-03-01

著者

• Takahashi Hiroshi

  Graduate School of Environmental Studies, Tohoku University

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• KOBAYASHI Shin-ya

  Graduate School of Science and Engineering, Ehime University

• TAKAMATSU Yuzo

  Graduate School of Science and Engineering, Ehime University

• Takahasi Hiroshi

  The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku

• Kobayashi S

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Takamatsu Y

  Graduate School Of Science And Engineering Ehime University

• Higami Y

  Graduate School Of Science And Engineering Ehime University

• Takahashi H

  Graduate School Of Science And Engineering Ehime University

• Kadoyama Shuhei

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• Takahashi Hiroshi

  Graduate School Of Environmental Studies Tohoku University

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