Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors

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概要

• 論文の詳細を見る

• Physical defects that are not covered by stuck-at fault or bridging fault model are increasing in LSI circuits designed and manufactured in modern Deep Sub-Micron (DSM) technologies. Therefore, it is necessary to target non-stuck-at and non-bridging faults. A stuck-open is one such fault model that captures transistor level defects. This paper presents two methods for maximizing stuck-open fault coverage using stuck-at test vectors. In this paper we assume that a test set to detect stuck-at faults is given and we consider two formulations for maximizing stuck-open coverage using the given test set as follows. The first problem is to form a test sequence by using each test vector multiple times, if needed, as long as the stuck-open coverage is increased. In this case the target is to make the resultant test sequence as short as possible under the constraint that the maximum stuck-open coverage is achieved using the given test set. The second problem is to form a test sequence by using each test vector exactly once only. Thus in this case the length of the test sequence is maintained as the number of given test vectors. In both formulations the stuck-at fault coverage does not change. The effectiveness of the proposed methods is established by experimental results for benchmark circuits.

• （社）電子情報通信学会の論文
• 2008-12-01

著者

• Takahashi Hiroshi

  Graduate School of Environmental Studies, Tohoku University

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• KOBAYASHI Shin-ya

  Graduate School of Science and Engineering, Ehime University

• TAKAMATSU Yuzo

  Graduate School of Science and Engineering, Ehime University

• Takahasi Hiroshi

  The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku

• Kobayashi S

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Takamatsu Y

  Graduate School Of Science And Engineering Ehime University

• Higami Y

  Graduate School Of Science And Engineering Ehime University

• Takahashi H

  Graduate School Of Science And Engineering Ehime University

• Kadoyama Shuhei

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• Takahashi Hiroshi

  Graduate School Of Environmental Studies Tohoku University

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