Takahashi H | Graduate School Of Science And Engineering Ehime University

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著作論文

A 100 MIPS High Speed and Low Power Digital Signal Processor (Special Issue on Low-Power and High-Speed LSI Technologies)
A 1.5 V, 200 MHz, 400 MIPS, 188μA/MHz and 1.2 V, 300 MHz, 600 MIPS, 169μA/MHz Digital Signal Processor Core for 3G Wireless Applications(Low-Power System LSI, IP and Related Technologies)
High-Speed and Low-Power Techniques of Hardware and Software for Digital Signal Processors
A Circuit Library for Low Power and High Speed Digital Signal Processor
Fabrication and Characterization of InGaAs/InAlAs Insulated Gate Pseudomorphic HENTs Having a Silicon Interface Control Layer
Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
Post-BIST Fault Diagnosis for Multiple Faults
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool

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