Takamatsu Yuzo | Department of Computer Science, Ehime University
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概要
関連著者
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Takamatsu Yuzo
Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science
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Takamatsu Yuzo
Department of Computer Science, Ehime University
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Takamatsu Y
Graduate School Of Science And Engineering Ehime University
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Takahashi Hiroshi
Department Of Cardiology Nihon University Surugadai Hospital
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Takahasi Hiroshi
The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku
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HIGAMI Yoshinobu
Department of Computer Science, Ehime University
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Higami Y
Graduate School Of Science And Engineering Ehime University
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Takahashi H
Graduate School Of Science And Engineering Ehime University
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Takahashi Hiroshi
Department Of Applied Aquabiology National Fisheries University
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Saluja Kewal
Department Of Electrical And Computer Engineering University Of Wisconsin-madison
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Saluja Kewal
Univ. Wisconsin‐madison Usa
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Saluja Kewal
Department Of Electrical & Computer Engineering Uw-madison
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Takahashi Hiroshi
Department of Cardiology, Nagoya Kyoritsu Hospital
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Yamazaki Koji
School Of Information And Communication Meiji University
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Kobayashi S
Graduate School Of Science And Engineering Ehime University
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Aikyo Takashi
Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science
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KOBAYASHI Shin-ya
Department of Computer Science, Ehime University
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Kadoyama Shuhei
Graduate School Of Science And Engineering Ehime University
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Kuwabara Shigeya
Department Of Electrical Engineering Faculty Of Science And Engineering Saga University
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KAJIHARA Seiji
Department of Computer Science and Electronics of Kyushu Institute of Technology
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Kajihara Seiji
Department Of Computer Sciences And Electronics Kyushu Institute Of Technology
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Takamatsu Yuzo
Department Of Electrical Engineering Faculty Of Science And Engineering Saga University
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POMERANZ Irith
School of Electrical and Computer Engineering, Purdue University
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KADOYAMA Shuhei
Department of Electrical and Electronic Engineering and Computer Science, Graduate School of Science
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AIKYO Takashi
Semiconductor Technology Academic Research Center (STARC)
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SATO Yasuo
Semiconductor Technology Academic Research Center (STARC)
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Pomeranz Irith
School Of Electrical And Computer Engineering Purdue University
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PHADOONGSIDHI Marong
Department of Electrical and Computer Engineering, University of Wisconsis
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Kadoyama Shuhei
Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science
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Phadoongsidhi Marong
Department Of Electrical And Computer Engineering University Of Wisconsis
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KAWABARA Shigeya
Department of Electrical Engineering, Faculty of Science and Engineering, Saga University
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Kawabara Shigeya
Department Of Electrical Engineering Faculty Of Science And Engineering Saga University
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Sato Yasuo
Semiconductor Technology Academic Research Center
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Takahashi H
Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science And Engineering Ehime University
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Aikyo Takashi
Semiconductor Technology Academic Research Center
著作論文
- On Finding Don't Cares in Test Sequences for Sequential Circuits(Dependable Computing)
- Generation of Test Sequences with Low Power Dissipation for Sequential Circuits(Test Generation and Compaction)(Test and Verification of VLSI)
- Post-BIST Fault Diagnosis for Multiple Faults
- Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
- Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
- Variation of Electron Diffraction Intensities with Energy Loss. : I. Gold, Silver and Aluminium Films
- Variation of Electron Diffraction Intensities with Energy Loss. : II. NaCl, CuCl and BiOCl Films