KOBAYASHI Shin-ya | Department of Computer Science, Ehime University
スポンサーリンク
概要
関連著者
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Kobayashi S
Graduate School Of Science And Engineering Ehime University
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Takamatsu Y
Graduate School Of Science And Engineering Ehime University
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Takamatsu Yuzo
Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science
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HIGAMI Yoshinobu
Department of Computer Science, Ehime University
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KOBAYASHI Shin-ya
Department of Computer Science, Ehime University
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Higami Y
Graduate School Of Science And Engineering Ehime University
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Kadoyama Shuhei
Graduate School Of Science And Engineering Ehime University
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Takamatsu Yuzo
Department of Computer Science, Ehime University
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KAJIHARA Seiji
Department of Computer Science and Electronics of Kyushu Institute of Technology
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Kajihara Seiji
Department Of Computer Sciences And Electronics Kyushu Institute Of Technology
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POMERANZ Irith
School of Electrical and Computer Engineering, Purdue University
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Pomeranz Irith
School Of Electrical And Computer Engineering Purdue University
著作論文
- On Finding Don't Cares in Test Sequences for Sequential Circuits(Dependable Computing)
- Generation of Test Sequences with Low Power Dissipation for Sequential Circuits(Test Generation and Compaction)(Test and Verification of VLSI)