Kobayashi S | Graduate School Of Science And Engineering Ehime University

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概要

• Kobayashi Satoshiの詳細を見る
• 同名の論文著者
• Graduate School Of Science And Engineering Ehime Universityの論文著者

関連著者

• Kobayashi S

  Graduate School Of Science And Engineering Ehime University

• Takamatsu Y

  Graduate School Of Science And Engineering Ehime University

• Higami Y

  Graduate School Of Science And Engineering Ehime University

• Kadoyama Shuhei

  Graduate School Of Science And Engineering Ehime University

• Takahashi Hiroshi

  Graduate School of Environmental Studies, Tohoku University

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• KOBAYASHI Shin-ya

  Graduate School of Science and Engineering, Ehime University

• TAKAMATSU Yuzo

  Graduate School of Science and Engineering, Ehime University

• Takahasi Hiroshi

  The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Takahashi H

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• Takahashi Hiroshi

  Graduate School Of Environmental Studies Tohoku University

• Takamatsu Yuzo

  Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science

• HIGAMI Yoshinobu

  Department of Computer Science, Ehime University

• KOBAYASHI Shin-ya

  Department of Computer Science, Ehime University

• Takamatsu Yuzo

  Department of Computer Science, Ehime University

• Kobayashi Satoshi

  Department of Aging Medicine and Geriatrics, Shinshu University, Graduate School of Medicine

• Akutsu T

  Mechanical Engineering Lab. Ibaraki Jpn

• Akutsu Tatsuya

  Mechanical Engineering Laboratory

• Hori Koichi

  Faculty of Engineering, The University of Tokyo

• Ohsuga Setsuo

  Faculty of Engineering, The University of Tokyo

• KAJIHARA Seiji

  Department of Computer Science and Electronics of Kyushu Institute of Technology

• Hori Koichi

  Faculty Of Engineering The University Of Tokyo

• Kajihara Seiji

  Department Of Computer Sciences And Electronics Kyushu Institute Of Technology

• POMERANZ Irith

  School of Electrical and Computer Engineering, Purdue University

• Ohsuga Setsuo

  Faculty Of Engineering The University Of Tokyo

• Pomeranz Irith

  School Of Electrical And Computer Engineering Purdue University

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著作論文

• Algorithms for Finding the Largest Subtree whose Copies Cover All the Leaves
• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
• Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
• On Finding Don't Cares in Test Sequences for Sequential Circuits(Dependable Computing)
• Generation of Test Sequences with Low Power Dissipation for Sequential Circuits(Test Generation and Compaction)(Test and Verification of VLSI)
• Problems and Solutions on IDDQ Testing

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