KOBAYASHI Shin-ya | Graduate School of Science and Engineering, Ehime University

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概要

• KOBAYASHI Shin-yaの詳細を見る
• 同名の論文著者
• Graduate School of Science and Engineering, Ehime Universityの論文著者

関連著者

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• KOBAYASHI Shin-ya

  Graduate School of Science and Engineering, Ehime University

• Takahashi Hiroshi

  Graduate School of Environmental Studies, Tohoku University

• SALUJA KEWAL

  Department of Electrical and Computer Engineering, University of Wisconsin-Madison

• TAKAMATSU Yuzo

  Graduate School of Science and Engineering, Ehime University

• Takahashi Hiroshi

  Graduate School Of Environmental Studies Tohoku University

• Takahasi Hiroshi

  The Authors Are With Application Specific Products Worldwide Development Dsp Development Japan Tsuku

• Kobayashi S

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical And Computer Engineering University Of Wisconsin-madison

• Saluja Kewal

  Univ. Wisconsin‐madison Usa

• Takamatsu Y

  Graduate School Of Science And Engineering Ehime University

• Higami Y

  Graduate School Of Science And Engineering Ehime University

• Takahashi H

  Graduate School Of Science And Engineering Ehime University

• Kadoyama Shuhei

  Graduate School Of Science And Engineering Ehime University

• Saluja Kewal

  Department Of Electrical & Computer Engineering Uw-madison

• SALUJA Kewal

  University of Wisconsin-Madison

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著作論文

• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
• Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
• Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment

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