SALUJA Kewal | University of Wisconsin-Madison
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概要
関連著者
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SALUJA Kewal
University of Wisconsin-Madison
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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Fujiwara H
The Authors Are With The Nara Institute Of Science And Technology (naist)
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Singh Virendra
The Authors Are With The Nara Institute Of Science And Technology (naist)
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Inoue Michiko
The Authors Are With The Nara Institute Of Science And Technology (naist)
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Inoue Michiko
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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SALUJA Kewal
The author is with the University of Wisconsin-Madison
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Singh Virendra
Nara Institute of Science & Technology
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Inoue Michiko
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Saluja K
Department Of Electrical And Computer Engineering University Of Wisconsin-madison
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Fujiwara Hideo
University of Wisconsin - Madison, U.S.A
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HIGAMI Yoshinobu
Graduate School of Science and Engineering, Ehime University
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KOBAYASHI Shin-ya
Graduate School of Science and Engineering, Ehime University
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MIYASE Kohei
Kyushu Institute of Technology
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WEN Xiaoqing
Kyushu Institute of Technology
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FURUKAWA Hiroshi
Kyushu Institute of Technology
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YAMATO Yuta
Kyushu Institute of Technology
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KAJIHARA Seiji
Kyushu Institute of Technology
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Ohtake Satoshi
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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Ohtake Satoshi
Nara Institute Of Science And Technology (naist)
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梶原 誠司
九州工業大学:jst Crest
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Fujiwara Hideo
Computer Design And Test Lab Nara Institute Of Science And Technology
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Fujiwara Hideo
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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NAKAZATO Masato
Nara Institute of Science and Technology (NAIST)
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FJIWARA Hideo
Nara Institute of Science & Technology
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Hatayama Kazumi
Starc
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Clouqueur Thomas
Nara Institute Of Science And Technology (naist)
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Clouqueur Thomas
Nara Institute Of Science And Technology
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梶原 誠司
九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化システムセンター
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梶原 誠司
九州工業大学情報工学部電子情報工学科:九州工業大学マイクロ化総合技術センタ
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Saluja Kewal
Department Of Electrical And Computer Engineering University Of Wisconsin-madison
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Saluja Kewal
Univ. Wisconsin‐madison Usa
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Miyase K
Kyushu Institute Of Technology
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Fujiwara Hideo
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Kajihara S
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Kajihara Seiji
Kyushu Insteitute Of Technology
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Yamashita Yoshiyuki
Densotechno Co.
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TAKASHIMA Atsushi
Kyushu Institute of Technology
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NODA Kenji
STARC
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ITO Hideaki
STARC
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AIKYO Takashi
STARC
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NAKAMURA Yoshiyuki
Nara Institute of Science and Technology (NAIST)
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Kajihara Seiji
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Miyase Kohei
Faculty Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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Xiaoqing Wen
Department Of Information Engineering Mining College Akita University
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Kajihara Seiji
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Takahashi Hiroshi
Graduate School Of Environmental Studies Tohoku University
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Ohtake Satoshi
Nara Institute of Science and Technology
著作論文
- Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability(Dependable Computing)
- Program-Based Delay Fault Self-Testing of Processor Cores
- Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
- Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
- Program-Based Delay Fault Self-Testing of Processor Cores (デザインガイア2003--VLSI設計の新しい大地を考える研究会)
- Program-Based Delay Fault Self-Testing of Processor Cores
- A Study of Capture-Safe Test Generation Flow for At-Speed Testing
- Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch(Dependable Computing)
- Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment