Ohtake Satoshi | Nara Institute of Science and Technology
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概要
関連著者
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Ohtake Satoshi
Nara Institute of Science and Technology
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Ohtake Satoshi
Nara Institute Of Science And Technology (naist)
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Ohtake Satoshi
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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Fujiwara Hideo
Computer Design And Test Lab Nara Institute Of Science And Technology
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Fujiwara Hideo
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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Inoue Michiko
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Fujiwara Hideo
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Inoue Michiko
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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NAKAZATO Masato
Nara Institute of Science and Technology (NAIST)
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YOSHIKAWA YUKI
Nara Institute of Science and Technology
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Yoneda Tomokazu
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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YONEDA Tomokazu
Nara Institute of Science and Technology (NAIST)
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SALUJA Kewal
University of Wisconsin-Madison
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Yoneda Tomokazu
Nara Institute Of Science And Technology
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Yoshikawa Yuki
Graduate School Of Information Science Nara Institute Of Science And Technology
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Kajihara Seiji
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Inoue Michiko
Nara Institute of Science and Technology
著作論文
- D-10-18 An Approach to Temperature Control During VLSI Test
- Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors
- Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability(Dependable Computing)
- Non-scan Design for Single-Port-Change Delay Fault Testability (特集:システムLSI設計とその技術)
- Non-scan Design for Single-Port-Change Delay Fault Testability
- Delay Testing: Improving Test Quality and Avoiding Over-testing