YONEDA Tomokazu | Nara Institute of Science and Technology (NAIST)

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概要

• YONEDA Tomokazuの詳細を見る
• 同名の論文著者
• Nara Institute of Science and Technology (NAIST)の論文著者

関連著者

• YONEDA Tomokazu

  Nara Institute of Science and Technology (NAIST)

• FUJIWARA Hideo

  Nara Institute of Science and Technology (NAIST)

• Yoneda Tomokazu

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• Fujiwara Hideo

  Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn

• SHUTO Akiko

  Hiroshima City University

• ICHIHARA Hideyuki

  Hiroshima City University

• INOUE Tomoo

  Hiroshima City University

• Inoue Michiko

  Nara Institute Of Science And Technology:japan Science And Technology Agency Crest

• Ohtake Satoshi

  Nara Institute Of Science And Technology:japan Science And Technology Agency Crest

• Ohtake Satoshi

  Nara Institute Of Science And Technology (naist)

• Fujiwara Hideo

  Computer Design And Test Lab Nara Institute Of Science And Technology

• Fujiwara Hideo

  Nara Institute Of Science And Technology:japan Science And Technology Agency Crest

• Inoue Michiko

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• Yoneda Tomokazu

  Nara Institute Of Science And Technology

• Masuda Kimihiko

  Nara Institute Of Science And Technology (naist)

• Fujiwara Hideo

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• MIYAZAKI Masahide

  Nara Institute of Science and Technology

• Inoue Tomoo

  Hiroshima City Univ. Hiroshima‐shi Jpn

• Ohtake Satoshi

  Nara Institute of Science and Technology

もっと見る 閉じる

著作論文

• Design and Optimization of Transparency-Based TAM for SoC Test
• D-10-18 An Approach to Temperature Control During VLSI Test
• A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips(Dependable Computing)
• Test Scheduling for Multi-Clock Domain SoCs under Power Constraint
• Design and Optimization of Transparency-Based TAM for SoC Test

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