Inoue Tomoo | Hiroshima City Univ. Hiroshima‐shi Jpn
スポンサーリンク
概要
関連著者
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Inoue Tomoo
Hiroshima City Univ. Hiroshima‐shi Jpn
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ICHIHARA Hideyuki
Hiroshima City University
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INOUE Tomoo
Hiroshima City University
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市原 英行
広島市立大学大学院情報科学研究科
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Ichihara Hideyuki
Graduate School Of Information Sciences Hiroshima City University
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Yoshikawa Yuki
Hiroshima City University
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Inoue Tomoo
Graduate School Of Information Science Hiroshima City University
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YONEDA Tomokazu
Nara Institute of Science and Technology (NAIST)
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SHUTO Akiko
Hiroshima City University
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Inoue T
Hiroshima City Univ. Hiroshima‐shi Jpn
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INOUE Tomoo
Graduate School of Information Science, Nara Institute of Science and Technology
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OHARA Toshihiro
Hiroshima City University
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SHINTANI Michihiro
Hiroshima City University
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Shintani Michihiro
Hiroshima City University:(present Office)matsushita Electric Industrial Co. Ltd.
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Yoshikawa Yuki
Graduate School Of Information Science Nara Institute Of Science And Technology
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Inoue Tomoo
Graduate School Of Information Sciences Hiroshima City University
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Inoue Tomoo
Graduate School Of Information Science Nara Institute Of Science And Technology
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Inoue Tomoo
Nara Institute Of Science And Technology
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Yoneda Tomokazu
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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SAIKI Tomoyuki
Graduate School of Information Sciences, Hiroshima City University
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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Saiki Tomoyuki
Graduate School Of Information Sciences Hiroshima City University
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Ohara Toshihiro
Hiroshima City University:(present Office)hitachi Electronics Services Co. Ltd.
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SUTOH Kenta
Hiroshima City University
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NUWA Tomomi
Graduate School of Information Science, Hiroshima City University
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Nuwa Tomomi
Graduate School Of Information Science Hiroshima City University
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Yoshikawa Yuki
Graduate School Of Information Science Hiroshima City University
著作論文
- A Variable-Length Coding Adjustable for Compressed Test Application
- An Architecture of Embedded Decompressor with Reconfigurability for Test Compression
- Design and Optimization of Transparency-Based TAM for SoC Test
- A Practical Threshold Test Generation for Error Tolerant Application
- Hybrid Test Application in Partial Skewed-Load Scan Design