INOUE Tomoo | Hiroshima City University
スポンサーリンク
概要
関連著者
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INOUE Tomoo
Hiroshima City University
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Inoue T
Hiroshima City Univ. Hiroshima‐shi Jpn
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ICHIHARA Hideyuki
Hiroshima City University
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Fujiwara Hideo
Naist
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Fujiwara Hideo
Nara Institute Of Science And Technology
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Inoue Tomoo
Nara Institute Of Science And Technology
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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市原 英行
広島市立大学大学院情報科学研究科
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Shintani Michihiro
Hiroshima City University:(present Office)matsushita Electric Industrial Co. Ltd.
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Inoue Tomoo
Hiroshima City Univ. Hiroshima‐shi Jpn
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YONEDA Tomokazu
Nara Institute of Science and Technology (NAIST)
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SHUTO Akiko
Hiroshima City University
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Fujiwara Hideo
Graduate School Of Information Science Nara Institute Of Science And Technology
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INOUE Tomoo
Graduate School of Information Science, Nara Institute of Science and Technology
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ICHIHARA HIDEYUKI
Faculty of Information Sciences, Hiroshima City University
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INOUE TOMOO
Faculty of Information Sciences, Hiroshima City University
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Ichihara Hideyuki
Faculty Of Information Sciences Hiroshima City University
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Inoue Tomoo
Graduate School Of Information Science Nara Institute Of Science And Technology
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Inoue Tomoo
Faculty Of Economics Seikei University
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Fujiwara Hideo
Graduate School Of Information Of Science Nara Institute Of Science And Technology
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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Inoue Tomoo
Graduate School Of Information Science Hiroshima City University
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INOUE TOMOO
The First Department of Internal Medicine, Kobe University, School of Medicine
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Inoue T
Graduate School Of Information Science Nara Institute Of Science And Technology
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MAEDA Hironori
Graduate School of Information Science, Nara Institute of Science and Technology
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OHARA Toshihiro
Hiroshima City University
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SHINTANI Michihiro
Hiroshima City University
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OCHI MASAKUNI
Graduate School of Information Sciences, Hiroshima City University
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SHINTANI MICHIHIRO
Graduate School of Information Sciences, Hiroshima City University
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ICHIHARA Hideyuki
the Faculty of Information Sciences, Hiroshima City University
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SHINTANI Michihiro
the Graduate School of Information Sciences, Hiroshima City University
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MICHINISHI Hiroyuki
the Faculty of Engineering, Okayama University of Science
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YOKOHIRA Tokumi
the Faculty of Engineering, Okayama University
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OKAMOTO Takuji
the Faculty of Engineering, Okayama University
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INOUE Tomoo
the Graduate School of Information Science, Nara Institute of Science and Technology
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FUJIWARA Hideo
the Graduate School of Information Science, Nara Institute of Science and Technology
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Ochi Masakuni
Graduate School Of Information Sciences Hiroshima City University:presently With Koga Software Compa
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Yonezawa Tomonori
Matsushita Electric Industrial Co. Ltd.
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Inoue Tomoo
The Graduate School Of Information Science Nara Institute Of Science And Technology
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Fujiwara Hideo
The Graduate School Of Information Science Nara Institute Of Science And Technology
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Yoneda Tomokazu
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Inoue T
Hiroshima City University
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Okamoto T
Faculty Of Engineering Okayama University Of Science
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Maeda Hironori
Graduate School Of Information Science Nara Institute Of Science And Technology:2nd Ate Division Adv
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Yokohira Tokumi
Faculty Of Engineering Okayama University
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FUJII Takaharu
Graduate School of Information Science, Nara Institute of Science and Technology
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Yonezawa Yomonori
Matsushita Electric Industrial Co., Ltd.
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Inoue Tomoo
Faculty Of Information Sciences Hiroshima City University
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Fujii Takaharu
Graduate School Of Information Science Nara Institute Of Science And Technology:lsi Operation Unit N
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Inoue Tomoo
The First Department Of Internal Medicine
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Yoshikawa Yuki
Hiroshima City University
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Ohara Toshihiro
Hiroshima City University:(present Office)hitachi Electronics Services Co. Ltd.
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Michinishi Hiroyuki
Faculty Of Engineering Okayama University Of Science
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SUTOH Kenta
Hiroshima City University
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Yonezawa Yomonori
Matsushita Electric Industrial Co. Ltd.
著作論文
- Design and Optimization of Transparency-Based TAM for SoC Test
- On the Effect of Scheduling in Test Generation
- A Variable-Length Coding Adjustable for Compressed Test Application
- An Adaptive Decompressor for Test Application with Variable-Length Coding
- Huffman-Based Test Response Coding
- Testing for the Programming Circuit of SRAM-Based FPGAs
- Performance Analysis of Parallel Test Generation for Combinational Circuits
- Optimal Granularity of Parallel Test Generation on the Client-Agent-Server Model
- A Method of Test Generation for Acyclic Sequential Circuits Using Single Stuck-at Fault Combinational ATPG
- Design and Optimization of Transparency-Based TAM for SoC Test
- A Practical Threshold Test Generation for Error Tolerant Application